المؤلفون: Gunnam Suryanarayana, Karthik Chandran, Osamah Ibrahim Khalaf, Youseef Alotaibi, Abdulmajeed Alsufyani, Saleh Ahmed Alghamdi

المصدر: IEEE Access, Vol 9, Pp 71406-71417 (2021)

مصطلحات موضوعية: Deep learning, edge-preservation, MR imaging, residual network, stationary wavelet decomposition, super-resolution, Electrical engineering. Electronics. Nuclear engineering, TK1-9971

وصف الملف: electronic resource

العلاقة: https://ieeexploreTest.ieee.org/document/9423994/; https://doaj.org/toc/2169-3536Test

الوصول الحر: https://doaj.org/article/f06aff6624c24492a0efb9602af343adTest

المؤلفون: Suryanarayana, P., Naik, A. A., Sridhar, CH., Murthy, V. S., Ravi Kiran, J., Chaturvedi, Sandeep, Prasad, S. D., Rao, A. V. S. K., Muralidharan, R., Koul, S. K.

المصدر: 2007 International Workshop on Physics of Semiconductor Devices

الإتاحة: https://doi.org/10.1109/iwpsd.2007.4472616Test
http://xplorestagingTest.ieee.org/ielx5/4459058/4472437/04472616.pdf?arnumber=4472616