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1مؤتمر
المؤلفون: Pesantes, KAH, Conca, E, Riccardo, S, Telesca, F, Signorelli, F, Tosi, A
المساهمون: Pesantes, Kah, Conca, E, Riccardo, S, Telesca, F, Signorelli, F, Tosi, A
وصف الملف: ELETTRONICO
العلاقة: info:eu-repo/semantics/altIdentifier/isbn/979-8-3503-0320-9; info:eu-repo/semantics/altIdentifier/wos/WOS:001018707400024; ispartofbook:2023 18th Conference on Ph.D Research in Microelectronics and Electronics (PRIME); 18th Conference on Ph.D Research in Microelectronics and Electronics (PRIME); firstpage:93; lastpage:96; numberofpages:4; https://hdl.handle.net/11311/1249381Test; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-85165010273; https://ieeexploreTest.ieee.org/document/10161763
الإتاحة: https://doi.org/10.1109/PRIME58259.2023.10161763Test
https://hdl.handle.net/11311/1249381Test
https://ieeexploreTest.ieee.org/document/10161763 -
2مؤتمر
المؤلفون: Falcone, V., Barzaghi, A., Signorelli, F., Bergamaschini, R., Valente, J., Paul, D., Tosi, A., Isella, G.
المصدر: 2023 IEEE Nanotechnology Materials and Devices Conference (NMDC)
الإتاحة: https://doi.org/10.1109/nmdc57951.2023.10343764Test
http://xplorestagingTest.ieee.org/ielx7/10343386/10343419/10343764.pdf?arnumber=10343764 -
3مؤتمر
المؤلفون: Signorelli, F., Telesca, F., Conca, E., Frera, A. Della, Ruggeri, A., Giudice, A., Tosi, A.
المصدر: 2021 IEEE International Electron Devices Meeting (IEDM)
الإتاحة: https://doi.org/10.1109/iedm19574.2021.9720559Test
http://xplorestagingTest.ieee.org/ielx7/9720433/9720494/09720559.pdf?arnumber=9720559