المؤلفون: Benzaouia, A., Mesquine, F., Benhayoun, M., Schulte, H., Georg, S.

المصدر: 2015 4th International Conference on Systems and Control (ICSC)

الإتاحة: https://doi.org/10.1109/icosc.2015.7152762Test
http://xplorestagingTest.ieee.org/ielx7/7136559/7152706/07152762.pdf?arnumber=7152762

المؤلفون: Schulte, H.

المصدر: Proceedings, 2005 IEEE/ASME International Conference on Advanced Intelligent Mechatronics.

الإتاحة: https://doi.org/10.1109/aim.2005.1511150Test
http://xplorestagingTest.ieee.org/ielx5/10040/32215/01511150.pdf?arnumber=1511150

المؤلفون: Schulte, H.

المصدر: Proceedings of the 44th IEEE Conference on Decision and Control

الإتاحة: https://doi.org/10.1109/cdc.2005.1582685Test
http://xplorestagingTest.ieee.org/ielx5/10559/33412/01582685.pdf?arnumber=1582685

المؤلفون: Osegueda, R.A., Ferregut, C., Kreinovichl, V., Seetharami, S., Schulte, H.

المصدر: PeachFuzz 2000. 19th International Conference of the North American Fuzzy Information Processing Society - NAFIPS (Cat. No.00TH8500)

الإتاحة: https://doi.org/10.1109/nafips.2000.877450Test
http://xplorestagingTest.ieee.org/ielx5/7041/18959/00877450.pdf?arnumber=877450

المؤلفون: Angert, N., Dahl, L., Glatz, J., Klabunde, J., Ratzinger, U., Schulte, H., Wolf, B., Deitinghoff, H., Friedrich, J., Klein, H., Schempp, A.

المصدر: Conference Record of the 1991 IEEE Particle Accelerator Conference

الإتاحة: https://doi.org/10.1109/pac.1991.165161Test
http://xplorestagingTest.ieee.org/ielx2/579/4252/00165161.pdf?arnumber=165161

المؤلفون: Heydari, H., Schulte, H.

المصدر: Proceedings of the 1997 Particle Accelerator Conference (Cat. No.97CH36167)

الإتاحة: https://doi.org/10.1109/pac.1997.751288Test
http://xplorestagingTest.ieee.org/ielx4/6051/16227/00751288.pdf?arnumber=751288

المؤلفون: Nolden, F., Baumann, S., Beckert, K., Eickhoff, H., Franczak, B., Franzke, B., Klepper, O., Konig, W., Schaaf, U., Schulte, H., Spadtke, P., Steck, M., Struckmeier, J.

المصدر: Conference Record of the 1991 IEEE Particle Accelerator Conference

الإتاحة: https://doi.org/10.1109/pac.1991.165134Test
http://xplorestagingTest.ieee.org/ielx2/579/4252/00165134.pdf?arnumber=165134

المؤلفون: Manchanda, L., Green, M.L., van Dover, R.B., Morris, M.D., Kerber, A., Hu, Y., Han, J.-P., Silverman, P.J., Sorsch, T.W., Weber, G., Donnelly, V., Pelhos, K., Klemens, F., Ciampa, N.A., Kornblit, A., Kim, Y.O., Bower, J.E., Barr, D., Ferry, E., Jacobson, D., Eng, J., Busch, B., Schulte, H.

المصدر: International Electron Devices Meeting 2000. Technical Digest. IEDM (Cat. No.00CH37138)

الإتاحة: https://doi.org/10.1109/iedm.2000.904250Test
http://xplorestagingTest.ieee.org/ielx5/7241/19535/00904250.pdf?arnumber=904250

المؤلفون: Schulte, H., Hahn, H.

المصدر: 2001 IEEE/ASME International Conference on Advanced Intelligent Mechatronics. Proceedings (Cat. No.01TH8556)

الإتاحة: https://doi.org/10.1109/aim.2001.936761Test
http://xplorestagingTest.ieee.org/ielx5/7453/20266/00936761.pdf?arnumber=936761

المؤلفون: Gerland, P., Gross, D., Schulte, H., Kroll, A.

المصدر: 2010 49th IEEE Conference on Decision & Control (CDC); 2010, p4373-4378, 6p