المؤلفون: Lee, Sangrok, Park, Eunsoo, Yi, Hongsuk, Lee, Sang Hun

المصدر: 2020 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops (CVPRW)

الإتاحة: https://doi.org/10.1109/cvprw50498.2020.00312Test
http://xplorestagingTest.ieee.org/ielx7/9142289/9150305/09151056.pdf?arnumber=9151056

المؤلفون: Lee, Youngwan, Kim, Huieun, Park, Eunsoo, Cui, Xuenan, Kim, Hakil

المصدر: 2017 IEEE Intelligent Vehicles Symposium (IV)

الإتاحة: https://doi.org/10.1109/ivs.2017.7995808Test
http://xplorestagingTest.ieee.org/ielx7/7987634/7995688/07995808.pdf?arnumber=7995808

المؤلفون: Kim, Huieun, Lee, Youngwan, Yim, Byeounghak, Park, Eunsoo, Kim, Hakil

المصدر: 2016 IEEE International Conference on Consumer Electronics-Asia (ICCE-Asia)

الإتاحة: https://doi.org/10.1109/icce-asia.2016.7804765Test
http://xplorestagingTest.ieee.org/ielx7/7786786/7804716/07804765.pdf?arnumber=7804765

المؤلفون: Jang, Cheolyong, Kim, Hyoungrae, Park, Eunsoo, Kim, Hakil

المصدر: 2016 International Conference on Electronics, Information, and Communications (ICEIC)

الإتاحة: https://doi.org/10.1109/elinfocom.2016.7562938Test
http://xplorestagingTest.ieee.org/ielx7/7553651/7562912/07562938.pdf?arnumber=7562938

المؤلفون: Lee, Youngwan, Kim, Huien, Park, Eunsoo, Yim, Byeonghak, Kim, Hakil

المصدر: 2016 IEEE International Conference on Consumer Electronics-Asia (ICCE-Asia)

الإتاحة: https://doi.org/10.1109/icce-asia.2016.7804821Test
http://xplorestagingTest.ieee.org/ielx7/7786786/7804716/07804821.pdf?arnumber=7804821

المؤلفون: Park, Eunsoo, Kim, Weonjin, Li, Qiongxiu, Kim, Jungmin, Kim, Hakil

المصدر: 2016 International Conference of the Biometrics Special Interest Group (BIOSIG)

الإتاحة: https://doi.org/10.1109/biosig.2016.7736923Test
http://xplorestagingTest.ieee.org/ielx7/7736796/7736893/07736923.pdf?arnumber=7736923

المؤلفون: Zhang, Rui, Park, Eunsoo, Yun, Yongji, Kim, Hakil, Kim, Hyoungrae

المصدر: 2012 IEEE 75th Vehicular Technology Conference (VTC Spring)

الإتاحة: https://doi.org/10.1109/vetecs.2012.6240334Test
http://xplorestagingTest.ieee.org/ielx5/6238551/6239848/06240334.pdf?arnumber=6240334

المؤلفون: Kim, Junchul, Park, Eunsoo, Cui, Xuenan, Kim, Hakil, Gruver, William A.

المصدر: 2009 IEEE International Conference on Systems, Man and Cybernetics

الإتاحة: https://doi.org/10.1109/icsmc.2009.5346612Test
http://xplorestagingTest.ieee.org/ielx5/5340904/5345886/05346612.pdf?arnumber=5346612

المؤلفون: Jin, Changlong, Kim, Hakil, Cui, Xuenan, Park, Eunsoo, Kim, Junchul, Hwang, Jinsoo, Elliott, Stephen

المصدر: 2009 Second International Symposium on Electronic Commerce and Security

الإتاحة: https://doi.org/10.1109/isecs.2009.59Test
http://xplorestagingTest.ieee.org/ielx5/5209635/5209640/05209773.pdf?arnumber=5209773

المؤلفون: Kim, Jonghee, Lee, Jonghwan, Lee, Chungsu, Park, Eunsoo, Kim, Junmin, Kim, Hakil, Lee, Jaeeun, Jeong, Hoeri

المصدر: 2013 IEEE International Conference on Systems, Man & Cybernetics; 2013, p239-242, 4p