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1
المؤلفون: Li Zhe, Xie Meilin, Li Zhiguo, Gao Xin, Lu Changming, Lian Xuezhen, Cao Yu, Huang Wei
المصدر: 2019 IEEE 9th International Conference on Electronics Information and Emergency Communication (ICEIEC).
مصطلحات موضوعية: Computer science, Process (computing), 02 engineering and technology, Kalman filter, Filter (signal processing), 021001 nanoscience & nanotechnology, Tracking (particle physics), 01 natural sciences, 010309 optics, Extended Kalman filter, Differentiator, Control theory, 0103 physical sciences, 0210 nano-technology, Encoder, Theodolite
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::20c46f4b2aa0f3e2c3d64d52bd16b0e0Test
https://doi.org/10.1109/iceiec.2019.8784599Test -
2
المؤلفون: Li Zhiguo, Ding Tongguo, Xu Jie, Huang Chong
المصدر: 2018 China Semiconductor Technology International Conference (CSTIC).
مصطلحات موضوعية: Materials science, Passivation, Alloy, chemistry.chemical_element, engineering.material, Metal, chemistry, Chemical engineering, Stack (abstract data type), Sputtering, Etching (microfabrication), visual_art, engineering, visual_art.visual_art_medium, Tin
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::8c413705d7c11fed29af4636ff922a39Test
https://doi.org/10.1109/cstic.2018.8369243Test -
3
المؤلفون: Li Haiying, Chang Baoli, Li Zhiguo, Wang Yongping, Zhao Wenqiang
المصدر: 2016 IEEE PES Transmission & Distribution Conference and Exposition-Latin America (PES T&D-LA).
مصطلحات موضوعية: Computer science, business.industry, 020209 energy, Control (management), Automatic frequency control, Electrical engineering, 02 engineering and technology, Grid, Reliability engineering, Power (physics), Reliability (semiconductor), Transmission (telecommunications), Control theory, 0202 electrical engineering, electronic engineering, information engineering, High-voltage direct current, business
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::c4e211951d10906050243f458f5342c6Test
https://doi.org/10.1109/tdc-la.2016.7805598Test -
4
المؤلفون: Li Zhiguo, Yuan Jiugen, Xing Ruonan
المصدر: 2015 10th International Conference on Computer Science & Education (ICCSE).
مصطلحات موضوعية: Multimedia, business.industry, Computer science, Process (engineering), ComputingMilieux_COMPUTERSANDEDUCATION, Information technology, Network application, business, computer.software_genre, computer, Flipped classroom, Hardware_LOGICDESIGN
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::3b1c5ac1fd5e71b136c19d7e0123b47bTest
https://doi.org/10.1109/iccse.2015.7250368Test -
5
المؤلفون: James Yingbo Jia, Salim Sammie, Boon Keat Toh, Li Zhiguo, Fethi Dhaoui, Patty Liu, Pavan Singaraju, Zhao Bing Li, Jing Horng Gau, Yau Kae Sheu, Habtom Micael, Frank Hawley, Tzu-Yun Chang, Ren Chi
المصدر: 2012 IEEE International Integrated Reliability Workshop Final Report.
مصطلحات موضوعية: Engineering, Flash (photography), business.industry, Hardware_INTEGRATEDCIRCUITS, Electrical engineering, Process (computing), Failure rate, Process optimization, Oxidation process, business, Field-programmable gate array, Hardware_LOGICDESIGN
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::74ef845cc677085ee8d13fa30c7b1f1bTest
https://doi.org/10.1109/iirw.2012.6468933Test -
6
المؤلفون: Chen Jianxiao, Li Zhiguo, Jia Limin, Pang Shaohuang, Tian Yin, Peng Wenlong, Dong Honghui
المصدر: ICDMA
مصطلحات موضوعية: Engineering, business.industry, Embedded system, Real-time computing, Rail traffic, Point (geometry), business, Wireless sensor network, Performance index, Data transmission, Safety monitoring
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::265c4d3a6446fadbdf3af4b03c650d0eTest
https://doi.org/10.1109/icdma.2012.38Test -
7
المؤلفون: Xiaoling Zhang, Xie Xuesong, Li Zhiguo, Changzhi Lv
المصدر: The Proceedings of 2011 9th International Conference on Reliability, Maintainability and Safety.
مصطلحات موضوعية: Engineering, business.industry, Bipolar junction transistor, Transistor, Electronic packaging, Electrical engineering, Humidity, Test method, Automotive engineering, law.invention, Stress (mechanics), Reliability (semiconductor), law, visual_art, Electronic component, visual_art.visual_art_medium, business
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::7d210a81899acacb96cd1d3a1324adf0Test
https://doi.org/10.1109/icrms.2011.5979425Test -
8
المؤلفون: Li Zhiguo, Sun Yongshu, Yue Suge
المصدر: 2009 IEEE International Conference of Electron Devices and Solid-State Circuits (EDSSC).
مصطلحات موضوعية: Engineering, Electrostatic discharge, business.industry, Electrical engineering, Phase (waves), Hardware_PERFORMANCEANDRELIABILITY, Power (physics), CMOS, Logic gate, Hardware_INTEGRATEDCIRCUITS, Electronic engineering, Inverter, Network synthesis filters, business, NMOS logic, Hardware_LOGICDESIGN
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::f895ddc4c7557b1c55f91653266a0962Test
https://doi.org/10.1109/edssc.2009.5394179Test -
9
المؤلفون: Lv Changzhi, Wang Yuanchun, Li Zhiguo, Guo Chun-Sheng, Li Fei, Ma Weidong
المصدر: 2009 16th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits.
مصطلحات موضوعية: Materials science, business.industry, Electrical engineering, Schottky diode, Integrated circuit, Finite element method, law.invention, Reliability (semiconductor), law, Thermal, Integrated circuit packaging, business, Thermal analysis, Power density
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::b778568ca1d88eb33cccfc7f86c5e953Test
https://doi.org/10.1109/ipfa.2009.5232619Test -
10
المؤلفون: Zhang Yuezong, Ma Weidong, Feng Shiwei, Lv Changzhi, Guo Chun-Sheng, Bai Yun-Xia, Li Zhiguo
المصدر: 2009 16th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits.
مصطلحات موضوعية: Stress (mechanics), Acceleration, Reliability (semiconductor), Materials science, business.industry, Scientific method, Electronic engineering, Degradation (geology), Semiconductor device, Degradation test, Process engineering, business
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::ce8a62b713e27bc86212c79ca63050e6Test
https://doi.org/10.1109/ipfa.2009.5232608Test