المؤلفون: Lee, Xin-Yue, Meng, Xiang-Zheng, Ji, Xin-Peng, Zhang, Chang-Lei, Tang, Xiu-Yuan, Wu, Yv-Han

المصدر: 2019 International Conference on Quality, Reliability, Risk, Maintenance, and Safety Engineering (QR2MSE)

الإتاحة: https://doi.org/10.1109/qr2mse46217.2019.9021218Test
http://xplorestagingTest.ieee.org/ielx7/9000742/9021108/09021218.pdf?arnumber=9021218

المؤلفون: Cai, Juan Juan, Jiang, Ying-Jie Ivy, Deng, Gui-Hong Dany, Kang, Sheng Randy, Lee, Xin Cindy, Gao, Hailin

المصدر: 2015 IEEE International Conference on Industrial Engineering and Engineering Management (IEEM)

الإتاحة: https://doi.org/10.1109/ieem.2015.7385783Test
http://xplorestagingTest.ieee.org/ielx7/7378213/7385591/07385783.pdf?arnumber=7385783

المؤلفون: Lee, Xin-Ru, Yang, Chih-Wen, Chen, Chih-Lung, Chang, Hsie-Chia, Lee, Chen-Yi

المصدر: ESSCIRC Conference 2015 - 41st European Solid-State Circuits Conference (ESSCIRC)

الإتاحة: https://doi.org/10.1109/esscirc.2015.7313837Test
http://xplorestagingTest.ieee.org/ielx7/7300343/7313811/07313837.pdf?arnumber=7313837

المؤلفون: Yang, Chih-Wen, Lee, Xin-Ru, Chen, Chih-Lung, Chang, Hsie-Chia, Lee, Chen-Yi

المصدر: 2014 IEEE International Symposium on Circuits and Systems (ISCAS)

الإتاحة: https://doi.org/10.1109/iscas.2014.6865152Test
http://xplorestagingTest.ieee.org/ielx7/6852006/6865048/06865152.pdf?arnumber=6865152

المؤلفون: Lee Xin Wei, Haseeb, A.S.M.A., Goh Yingxin

المصدر: 2012 4th Asia Symposium on Quality Electronic Design (ASQED)

الإتاحة: https://doi.org/10.1109/acqed.2012.6320518Test
http://xplorestagingTest.ieee.org/ielx5/6310182/6320457/06320518.pdf?arnumber=6320518

المؤلفون: Lee, Xin-Ru, Chen, Chih-Lung, Chang, Hsie-Chia, Lee, Chen-Yi

المصدر: 2012 IEEE International Symposium on Circuits and Systems

الإتاحة: https://doi.org/10.1109/iscas.2012.6271843Test
http://xplorestagingTest.ieee.org/ielx5/6257548/6270389/06271843.pdf?arnumber=6271843

المؤلفون: Lee, Xin-Ru, Chang, Hsie-Chia, Lee, Chen-Yi

المصدر: 2010 IEEE Asia Pacific Conference on Circuits and Systems

الإتاحة: https://doi.org/10.1109/apccas.2010.5774991Test
http://xplorestagingTest.ieee.org/ielx5/5767825/5774732/05774991.pdf?arnumber=5774991

المؤلفون: Lee Xin-wan, De-ming, Xu, Ke-qin, Wu, Lie-pu, Song, Xiang-ying, Wu

المصدر: 23rd European Microwave Conference, 1993

الإتاحة: https://doi.org/10.1109/euma.1993.336882Test
http://xplorestagingTest.ieee.org/ielx5/4136511/4136512/04136611.pdf?arnumber=4136611

المؤلفون: Lee, Xin-Ru, Yang, Chih-Wen, Chen, Chih-Lung, Chang, Hsie-Chia, Lee, Chen-Yi

المصدر: IEEE Transactions on Circuits & Systems. Part II: Express Briefs; Mar2015, Vol. 62 Issue 3, p301-305, 5p

المؤلفون: Lee, Xin-Ru¹, Chen, Chih-Lung¹, Chang, Hsie-Chia¹, Lee, Chen-Yi¹

المصدر: IEEE Transactions on Circuits & Systems. Part I: Regular Papers. Feb2015, Vol. 62 Issue 2, p507-516. 10p.

مصطلحات موضوعية: *ETHERNET, *COMPUTER architecture, LOW density parity check codes, DECODERS (Electronics), LOGIC circuits, ITERATIVE decoding