المؤلفون: Wang, J., Huang, X. Y., Fang, Y. T., Niu, F., Wu, L. J.

المصدر: 2018 XIII International Conference on Electrical Machines (ICEM)

الإتاحة: https://doi.org/10.1109/icelmach.2018.8506808Test
http://xplorestagingTest.ieee.org/ielx7/8478646/8506678/08506808.pdf?arnumber=8506808

المؤلفون: Chen, Y. Z., Fang, Y. T., Huang, X. Y., Zhang, J.

المصدر: 2016 IEEE Vehicle Power and Propulsion Conference (VPPC)

الإتاحة: https://doi.org/10.1109/vppc.2016.7791804Test
http://xplorestagingTest.ieee.org/ielx7/7791113/7791556/07791804.pdf?arnumber=7791804

المؤلفون: Zhao, S. F., Huang, X. Y., Fang, Y. T., Li, J.

المصدر: 2015 6th International Conference on Power Electronics Systems and Applications (PESA)

الإتاحة: https://doi.org/10.1109/pesa.2015.7398905Test
http://xplorestagingTest.ieee.org/ielx7/7393091/7398881/07398905.pdf?arnumber=7398905

المؤلفون: Zhou, J., Huang, X. Y., Gao, Y. Q., Fang, Y. T., Cao, S. H.

المصدر: 2015 18th International Conference on Electrical Machines and Systems (ICEMS)

الإتاحة: https://doi.org/10.1109/icems.2015.7385183Test
http://xplorestagingTest.ieee.org/ielx7/7366880/7384965/07385183.pdf?arnumber=7385183

المؤلفون: Huang, X. Y., Wang, H. Y., Wu, Z., Zhu, T., Wu, J. Z.

المصدر: 2013 International Conference on Materials for Renewable Energy and Environment

الإتاحة: https://doi.org/10.1109/icmree.2013.6893789Test
http://xplorestagingTest.ieee.org/ielx7/6881978/6893768/06893789.pdf?arnumber=6893789

المؤلفون: Lin, K.-P., Chen, B.-L., Huang, X.-Y., Liang, W.-L.

المصدر: 2010 8th World Congress on Intelligent Control and Automation

الإتاحة: https://doi.org/10.1109/wcica.2010.5554920Test
http://xplorestagingTest.ieee.org/ielx5/5535248/5553742/05554920.pdf?arnumber=5554920

المؤلفون: Jiao, G. F., Huang, X. Y., Chen, Z. X., Cao, W., Huang, D. M., Yu, H. Y., Singh, N., Lo, G. Q., Kwong, D.-L., Li, Ming-Fu

المصدر: 2010 10th IEEE International Conference on Solid-State and Integrated Circuit Technology

الإتاحة: https://doi.org/10.1109/icsict.2010.5667426Test
http://xplorestagingTest.ieee.org/ielx5/5658734/5667273/05667426.pdf?arnumber=5667426

المؤلفون: Jiao, G. F., Chen, Z. X., Yu, H. Y., Huang, X. Y., Huang, D. M., Singh, N., Lo, G. Q., Kwong, D.-L., Ming-Fu Li

المصدر: 2009 IEEE International Electron Devices Meeting (IEDM)

الإتاحة: https://doi.org/10.1109/iedm.2009.5424234Test
http://xplorestagingTest.ieee.org/ielx5/5419306/5424206/05424234.pdf?arnumber=5424234

المؤلفون: Oide, Y., Miyazaki, Y., Ono, Y., Huang, X. Y., Kajitani, T.

المصدر: 2006 25th International Conference on Thermoelectrics

الإتاحة: https://doi.org/10.1109/ict.2006.331282Test
http://xplorestagingTest.ieee.org/ielx5/4133214/4084513/04133315.pdf?arnumber=4133315

المؤلفون: Huang, X. Y., Miyazaki, Y., Yubuta, K., Oide, Y., Kajitani, T.

المصدر: 2006 25th International Conference on Thermoelectrics

الإتاحة: https://doi.org/10.1109/ict.2006.331287Test
http://xplorestagingTest.ieee.org/ielx5/4133214/4084513/04133243.pdf?arnumber=4133243