المؤلفون: Lu, Q. F., Li, Y. X., Huang, X. Y., Ye, Y. Y.

المصدر: IEEE Transactions on Magnetics; Nov2015, Vol. 51 Issue 11, p1-4, 4p

مصطلحات موضوعية: PERMANENT magnets, MACHINE theory, FINITE element method, ELECTRIC windings, TOPOLOGY

المؤلفون: Jia, X. L., Huang, X. Y., Tang, Y., Yang, L. H., Chen, D. J., Lu, H., Zhang, R., Zheng, Y. D.

المصدر: IEEE Electron Device Letters; Jul2016, Vol. 37 Issue 7, p913-915, 3p

مصطلحات موضوعية: PHOSPHATES, IMPRINTED polymers, MODULATION-doped field-effect transistors, ANIONS, ELECTRON gas

المؤلفون: Huang, X. Y., Jiao, G. F., Cao, W., Huang, D., Yu, H. Y., Chen, Z. X., Singh, N., Lo, G. Q., Kwong, D. L., Ming-Fu Li

المصدر: IEEE Electron Device Letters; Aug2010, Vol. 31 Issue 8, p779-781, 3p

مصطلحات موضوعية: FIELD-effect transistors, QUANTUM tunneling, OXIDES, SIMULATION methods & models, RELIABILITY (Personality trait), TRANSISTORS

المؤلفون: Jiao, G. F., Chen, Z. X., Yu, H. Y., Huang, X. Y., Huang, D. M., Singh, N., Lo, G. Q., Kwong, D.-L., Ming-Fu Li

المصدر: IEEE Electron Device Letters; May2010, Vol. 31 Issue 5, p396-398, 3p

مصطلحات موضوعية: FIELD-effect transistors, RELIABILITY in engineering, HOT carriers, TEMPERATURE, TRANSISTORS