المؤلفون: Liao, W.S., Chiang, C.C., Wu, W.M., Fan, C. H., Chiu, S.L., Chiu, C.C., Chen, T.Y., Hsieh, C.C., Chen, H.Y., Lo, H.Y., Huang, L.C., Wu, T.J., Chiou, W.C., Hou, S.Y., Jeng, S.P., Doug Yu

المصدر: 2014 Symposium on VLSI Technology (VLSI-Technology): Digest of Technical Papers

الإتاحة: https://doi.org/10.1109/vlsit.2014.6894398Test
http://xplorestagingTest.ieee.org/ielx7/6886509/6894335/06894398.pdf?arnumber=6894398

المؤلفون: Chiu, Y.T., Wang, Y.F., Lee, Y.-H., Liang, Y.C., Wang, T.C., Wu, S.Y., Hsieh, C.C., Wu, K.

المصدر: 2014 IEEE International Reliability Physics Symposium

الإتاحة: https://doi.org/10.1109/irps.2014.6861171Test
http://xplorestagingTest.ieee.org/ielx7/6850132/6860565/06861171.pdf?arnumber=6861171

المؤلفون: Chien, W.C., Lee, F.M., Lin, Y.Y., Lee, M.H., Chen, S.H., Hsieh, C.C., Lai, E.K., Hui, H.H., Huang, Y.K., Yu, C.C., Chen, C.F., Lung, H.L., Hsieh, K.Y., Lu, Chih-Yuan

المصدر: 2012 Symposium on VLSI Technology (VLSIT)

الإتاحة: https://doi.org/10.1109/vlsit.2012.6242507Test
http://xplorestagingTest.ieee.org/ielx5/6235083/6242429/06242507.pdf?arnumber=6242507

المؤلفون: Chang, H.B., Chen, H.Y., Kuo, P.C., Chien, C.H., Liao, E.B., Lin, T.C., Wei, T.S., Lin, Y.C., Chen, Y.H., Yang, K.F., Teng, H. A., Tsai, W.C., Tseng, Y.C., Chen, S.Y., Hsieh, C.C., Chen, M.F., Liu, Y.H., Wu, T.J., Hou, Shang Y., Chiou, W.C., Jeng, S.P., Yu, C.H.

المصدر: 2012 Symposium on VLSI Technology (VLSIT)

الإتاحة: https://doi.org/10.1109/vlsit.2012.6242517Test
http://xplorestagingTest.ieee.org/ielx5/6235083/6242429/06242517.pdf?arnumber=6242517

المؤلفون: Chiou, W.C., Yang, K.F., Yeh, J.L., Wang, S.H., Liou, Y.H., Wu, T.J., Lin, J.C., Huang, C.L., Lu, S.W., Hsieh, C.C., Teng, H.A., Chiu, C.C., Chang, H.B., Wei, T.S., Lin, Y.C., Chen, Y.H., Tu, H.J., Ko, H.D., Yu, T.H., Hung, J.P., Tsai, P.H., Yeh, D.C., Wu, W.C., Su, A.J., Chiu, S.L., Hou, S.Y., Shih, D.Y., Chen, Kim H., Jeng, S.P., Yu, C.H.

المصدر: 2012 Symposium on VLSI Technology (VLSIT)

الإتاحة: https://doi.org/10.1109/vlsit.2012.6242484Test
http://xplorestagingTest.ieee.org/ielx5/6235083/6242429/06242484.pdf?arnumber=6242484

المؤلفون: Hsieh, C.C., Hsu, P.L.

المصدر: 2005 IEEE International Conference on Systems, Man and Cybernetics

الإتاحة: https://doi.org/10.1109/icsmc.2005.1571329Test
http://xplorestagingTest.ieee.org/ielx5/10498/33255/01571329.pdf?arnumber=1571329

المؤلفون: Wei, C.C., Yu, C.H., Tung, C.H., Huang, R.Y., Hsieh, C.C., Chiu, C.C., Hsiao, H.Y., Chang, Y.W., Lin, C.K., Liang, Y.C., Chen, C., Yeh, T.C., Lin, L.C., Yu, D.C.H.

المصدر: 2011 IEEE 61st Electronic Components & Technology Conference (ECTC); 2011, p706-710, 5p

المؤلفون: Lin, Y.J., Hsieh, C.C., Yu, C.H., Tung, C.H., Yu, D.C.H.

المصدر: 2011 IEEE 61st Electronic Components & Technology Conference (ECTC); 2011, p634-638, 5p

المؤلفون: Pan, C.T., Hsieh, C.C., Lin, S.C.

المصدر: 2006 1st IEEE International Conference on Nano/Micro Engineered & Molecular Systems; 2006, p1064-1067, 4p

المؤلفون: Hsieh, C.C., Hsu, P.L.

المصدر: 2005 IEEE International Conference on Systems, Man & Cybernetics; 2005, p1314-1319, 6p