المؤلفون: da Silva, Felipe Augusto, Bagbaba, Ahmet Cagri, Sartoni, Sandro, Cantoro, Riccardo, Reorda, Matteo Sonza, Hamdioui, Said, Sauer, Christian

المساهمون: da Silva, Felipe Augusto, Bagbaba, Ahmet Cagri, Sartoni, Sandro, Cantoro, Riccardo, Reorda, Matteo Sonza, Hamdioui, Said, Sauer, Christian

مصطلحات موضوعية: ISO26262, Safe Faults, Fault Injection, Formal Methods, Simulation, Functional Safety, Verification

وصف الملف: ELETTRONICO

العلاقة: info:eu-repo/semantics/altIdentifier/isbn/978-1-7281-4312-5; info:eu-repo/semantics/altIdentifier/wos/WOS:000615974000012; ispartofbook:Proceedings - 2020 IEEE European Test Symposium (ETS); 2020 IEEE European Test Symposium (ETS); firstpage:1; lastpage:6; numberofpages:6; info:eu-repo/grantAgreement/EC/H2020/corda__h2020::7d942c89dda2c725c7de00d027cd2af7; http://hdl.handle.net/11583/2838375Test; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-85089139085

الإتاحة: https://doi.org/10.1109/ETS48528.2020.9131568Test
http://hdl.handle.net/11583/2838375Test

المؤلفون: Shahroodi, Taha, id_orcid:0 000-0003-4576-0030, Zahedi, Mahdi, Firtina, Can, id_orcid:0 000-0002-6548-7863, Alser, Mohammed, Wong, Stephan, Mutlu, Onur, Hamdioui, Said

المصدر: IEEE Access, 10

مصطلحات موضوعية: Food profiling, emerging memories, in memory processing, analog computing

وصف الملف: application/application/pdf

العلاقة: info:eu-repo/semantics/altIdentifier/wos/000841765100001; http://hdl.handle.net/20.500.11850/565227Test

الإتاحة: https://doi.org/20.500.11850/565227Test
https://doi.org/10.3929/ethz-b-000565227Test
https://doi.org/10.1109/access.2022.3195878Test
https://hdl.handle.net/20.500.11850/565227Test

المؤلفون: Fieback, Moritz, Medeiros, Guilherme Cardoso, Gebregiorgis, Anteneh, Aziza, Hassen, Taouil, Mottaqiallah, Hamdioui, Said

المساهمون: Delft University of Technology (TU Delft), Institut des Matériaux, de Microélectronique et des Nanosciences de Provence (IM2NP), Aix Marseille Université (AMU)-Université de Toulon (UTLN)-Centre National de la Recherche Scientifique (CNRS)

المصدر: 2021 IEEE European Test Symposium (ETS)
https://hal.science/hal-03502363Test
2021 IEEE European Test Symposium (ETS), May 2021, Bruges, France. pp.1-6, ⟨10.1109/ETS50041.2021.9465401⟩

مصطلحات موضوعية: RRAM test, defect modeling, device-aware test, [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics

جغرافية الموضوع: Bruges, France

العلاقة: hal-03502363; https://hal.science/hal-03502363Test; https://hal.science/hal-03502363/documentTest; https://hal.science/hal-03502363/file/Moritz%20ETS2021%20Intermittent_Undefined_State_Fault_in_RRAM_cam_ready_03%20-%20copie.pdfTest

الإتاحة: https://doi.org/10.1109/ETS50041.2021.9465401Test
https://hal.science/hal-03502363Test
https://hal.science/hal-03502363/documentTest
https://hal.science/hal-03502363/file/Moritz%20ETS2021%20Intermittent_Undefined_State_Fault_in_RRAM_cam_ready_03%20-%20copie.pdfTest

المؤلفون: Bosio, Alberto, O'Connor, Ian, Traiola, Marcello, Echavarria, Jorge, Teich, Jürgen, Hanif, Muhammad, Abdullah, Shafique, Muhammad, Hamdioui, Said, Deveautour, Bastien, Girard, Patrick, Virazel, Arnaud, Bertels, Koen

المساهمون: INL - Conception de Systèmes Hétérogènes (INL - CSH), Institut des Nanotechnologies de Lyon (INL), École Centrale de Lyon (ECL), Université de Lyon-Université de Lyon-Université Claude Bernard Lyon 1 (UCBL), Université de Lyon-École Supérieure de Chimie Physique Électronique de Lyon (CPE)-Institut National des Sciences Appliquées de Lyon (INSA Lyon), Université de Lyon-Institut National des Sciences Appliquées (INSA)-Institut National des Sciences Appliquées (INSA)-Centre National de la Recherche Scientifique (CNRS)-École Centrale de Lyon (ECL), Université de Lyon-Institut National des Sciences Appliquées (INSA)-Institut National des Sciences Appliquées (INSA)-Centre National de la Recherche Scientifique (CNRS), Friedrich-Alexander Universität Erlangen-Nürnberg = University of Erlangen-Nuremberg (FAU), Vienna University of Technology = Technische Universität Wien (TU Wien), New York University Abu Dhabi, NYU System (NYU), Delft University of Technology (TU Delft), Test and dEpendability of microelectronic integrated SysTems (TEST), Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier (LIRMM), Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS)-Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS)

المصدر: ETS 2021 - 26th IEEE European Test Symposium ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-03379074Test ; ETS 2021 - 26th IEEE European Test Symposium, May 2021, Bruges, Belgium. pp.1-10, ⟨10.1109/ETS50041.2021.9465409⟩

مصطلحات موضوعية: Emerging Computing Paradigm, Quantum Computing, Approximate Computing, AI hardware, Reliability, Testing, [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics

جغرافية الموضوع: Bruges, Belgium

العلاقة: lirmm-03379074; https://hal-lirmm.ccsd.cnrs.fr/lirmm-03379074Test; https://hal-lirmm.ccsd.cnrs.fr/lirmm-03379074/documentTest; https://hal-lirmm.ccsd.cnrs.fr/lirmm-03379074/file/Emerging_Computing_Devices_Challenges_and_Opportunities_for_Test_and_Reliability.pdfTest

الإتاحة: https://doi.org/10.1109/ETS50041.2021.9465409Test
https://hal-lirmm.ccsd.cnrs.fr/lirmm-03379074Test
https://hal-lirmm.ccsd.cnrs.fr/lirmm-03379074/documentTest
https://hal-lirmm.ccsd.cnrs.fr/lirmm-03379074/file/Emerging_Computing_Devices_Challenges_and_Opportunities_for_Test_and_Reliability.pdfTest

المؤلفون: Huang, Ruoyu, Aljuffri, Abdullah, Hamdioui, Said, Ma, Kezheng, Taouil, Mottaqiallah

المساهمون: Horizon Europe

المصدر: 2023 IEEE 22nd International Conference on Trust, Security and Privacy in Computing and Communications (TrustCom)

الإتاحة: https://doi.org/10.1109/trustcom60117.2023.00121Test
http://xplorestagingTest.ieee.org/ielx7/10538469/10538471/10538705.pdf?arnumber=10538705

المؤلفون: Yuan, Sicong, Taouil, Mottaqiallah, Fieback, Moritz, Xun, Hanzhi, Marinissen, Erik Jan, Kar, Gouri Sankar, Rao, Sidharth, Couet, Sebastien, Hamdioui, Said

المصدر: 2023 Design, Automation & Test in Europe Conference & Exhibition (DATE)

الإتاحة: https://doi.org/10.23919/date56975.2023.10137071Test
http://xplorestagingTest.ieee.org/ielx7/10136870/10136706/10137071.pdf?arnumber=10137071

المؤلفون: Xun, Hanzhi, Fieback, Moritz, Yuan, Sicong, Aziza, Hassen, Heidekamp, Mathijs, Copetti, Thiago, Poehls, Leticia Bolzani, Taouil, Mottaqiallah, Hamdioui, Said

المصدر: 2023 IEEE 32nd Asian Test Symposium (ATS)

الإتاحة: https://doi.org/10.1109/ats59501.2023.10317990Test
http://xplorestagingTest.ieee.org/ielx7/10317938/10317940/10317990.pdf?arnumber=10317990

المؤلفون: Aouichi, Ahmed, Yuan, Sicong, Fieback, Moritz, Rao, Siddharth, Kim, Woojin, Marinissen, Erik Jan, Couet, Sebastien, Taouil, Mottaqiallah, Hamdioui, Said

المصدر: 2023 IEEE 32nd Asian Test Symposium (ATS)

الإتاحة: https://doi.org/10.1109/ats59501.2023.10317952Test
http://xplorestagingTest.ieee.org/ielx7/10317938/10317940/10317952.pdf?arnumber=10317952

المؤلفون: Singh, Abhairaj, Bishnoi, Rajendra, Kaichouhi, Ali, Diware, Sumit, Joshi, Rajiv V., Hamdioui, Said

المصدر: 2023 IEEE 5th International Conference on Artificial Intelligence Circuits and Systems (AICAS)

الإتاحة: https://doi.org/10.1109/aicas57966.2023.10168647Test
http://xplorestagingTest.ieee.org/ielx7/10168547/10168548/10168647.pdf?arnumber=10168647

المؤلفون: Yaldagard, Mohammad Amin, Diware, Sumit, Joshi, Rajiv V., Hamdioui, Said, Bishnoi, Rajendra

المصدر: 2023 IEEE 5th International Conference on Artificial Intelligence Circuits and Systems (AICAS)

الإتاحة: https://doi.org/10.1109/aicas57966.2023.10168638Test
http://xplorestagingTest.ieee.org/ielx7/10168547/10168548/10168638.pdf?arnumber=10168638