المؤلفون: Sieni, E., Nemec, S., Lamberti, P., Romeo, S., Sgarbossa, P., Forzan, M., Golzio, M., Rols, M. P., Kolosnjaj-Tabi, J., Kralj, S.

المساهمون: Sieni, E., Nemec, S., Lamberti, P., Romeo, S., Sgarbossa, P., Forzan, M., Golzio, M., Rols, M. P., Kolosnjaj-Tabi, J., Kralj, S.

مصطلحات موضوعية: Aggregates, Cells, Dielectric properties, Electric fields, Nanoparticles, Transient analysis

وصف الملف: ELETTRONICO

العلاقة: info:eu-repo/semantics/altIdentifier/isbn/979-8-3503-3546-0; ispartofbook:2023 IEEE Nanotechnology Materials and Devices Conference, NMDC 2023; 2023 IEEE Nanotechnology Materials and Devices Conference (NMDC); firstpage:174; lastpage:179; numberofpages:6; serie:IEEE NANOTECHNOLOGY MATERIALS AND DEVICES CONFERENCE; https://hdl.handle.net/11577/3507488Test; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-85182016500

الإتاحة: https://doi.org/10.1109/NMDC57951.2023.10344060Test
https://hdl.handle.net/11577/3507488Test

المؤلفون: Di Barba, P, Mognaschi, ME, Dughiero, F, Forzan, M, Marconi, A, Lowther, DA, Sykulski, JK

المساهمون: Di Barba, P, Mognaschi, Me, Dughiero, F, Forzan, M, Marconi, A, Lowther, Da, Sykulski, Jk

مصطلحات موضوعية: Multiphysics analysi, surrogate model, finite element, deep learning

العلاقة: info:eu-repo/semantics/altIdentifier/isbn/978-1-6654-6833-6; info:eu-repo/semantics/altIdentifier/wos/WOS:000942521800182; ispartofbook:CEFC 2022 - 20th Biennial IEEE Conference on Electromagnetic Field Computation, Proceedings; CEFC 2022 - 20th Biennial IEEE Conference on Electromagnetic Field Computation; firstpage:1; lastpage:2; numberofpages:2; https://hdl.handle.net/11577/3478329Test; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-85143083739

الإتاحة: https://doi.org/10.1109/CEFC55061.2022.9940833Test
https://hdl.handle.net/11577/3478329Test

المؤلفون: Bertoluzzo M., Forzan M., Di Barba P., Mognaschi M. E., Sieni E.

المساهمون: AAVV, Bertoluzzo, M., Forzan, M., Di Barba, P., Mognaschi, M. E., Sieni, E.

مصطلحات موضوعية: WPTS, magneto-thermal analysi, finite element model, thermal measurements

العلاقة: info:eu-repo/semantics/altIdentifier/isbn/978-1-6654-6833-6; info:eu-repo/semantics/altIdentifier/wos/WOS:000942521800069; ispartofbook:CEFC 2022 - 20th Biennial IEEE Conference on Electromagnetic Field Computation, Proceedings; CEFC 2022 - 20th Biennial IEEE Conference on Electromagnetic Field Computation; firstpage:1; lastpage:2; numberofpages:2; https://hdl.handle.net/11383/2150571Test; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-85143056025

الإتاحة: https://doi.org/10.1109/CEFC55061.2022.9940706Test
https://hdl.handle.net/11383/2150571Test

المؤلفون: Petrášová, Iveta, Karban, Pavel, Forzan, M., Doležel, Ivo, di Barba, P.

مصطلحات موضوعية: electroheat processes, induction heating, coupled models, numerical analysis, material properties, analysis of sen­sitivity, DOE

وصف الملف: 4 s.; application/pdf

العلاقة: 13th International Conference Elektro 2020 : conference proceedings; PETRÁŠOVÁ, I. KARBAN, P. FORZAN, M. DOLEŽEL, I. DI BARBA, P.Sensitivity analysis of time of induction heating process on charge parameters. In: 13th International Conference Elektro 2020 : conference proceedings. Piscataway: IEEE, 2020. s. 1-4. ISBN 978-1-72817-542-3.; http://hdl.handle.net/11025/42932Test

الإتاحة: https://doi.org/10.1109/ELEKTRO49696.2020.9130260Test
http://hdl.handle.net/11025/42932Test

المؤلفون: Bertoluzzo, M., Forzan, M., Di Barba, P., Mognaschi, M.E., Sieni, E.

المصدر: 2019 19th International Symposium on Electromagnetic Fields in Mechatronics, Electrical and Electronic Engineering (ISEF)

الإتاحة: https://doi.org/10.1109/isef45929.2019.9097092Test
http://xplorestagingTest.ieee.org/ielx7/9094541/9096888/09097092.pdf?arnumber=9097092

المؤلفون: di Barba, P., Mognaschi, M. E., Forzan, M., Lupi, S., Sieni, E.

المصدر: IECON 2019 - 45th Annual Conference of the IEEE Industrial Electronics Society

الإتاحة: https://doi.org/10.1109/iecon.2019.8926875Test
http://xplorestagingTest.ieee.org/ielx7/8897531/8926608/08926875.pdf?arnumber=8926875

المؤلفون: Mognaschi, M.E., Sundararajan, R., Campana, L.G., Forzan, M., Sgarbossa, P., Sieni, E.

المصدر: IECON 2018 - 44th Annual Conference of the IEEE Industrial Electronics Society

الإتاحة: https://doi.org/10.1109/iecon.2018.8591435Test
http://xplorestagingTest.ieee.org/ielx7/8560606/8591058/08591435.pdf?arnumber=8591435

المؤلفون: Campana, L. G., Di Barba, P., Mognaschi, M. E., Bullo, M., Dughiero, F., Forzan, M., Sgarbossa, P., Sieni, E.

المصدر: 2017 18th International Symposium on Electromagnetic Fields in Mechatronics, Electrical and Electronic Engineering (ISEF) Book of Abstracts

الإتاحة: https://doi.org/10.1109/isef.2017.8090702Test
http://xplorestagingTest.ieee.org/ielx7/8081729/8090663/08090702.pdf?arnumber=8090702

المؤلفون: Campana, L.G., Di Barba, P., Mognaschi, M. E., Bullo, M., Dughiero, F., Forzan, M., Sgarbossa, P., Spessot, E., Sieni, E.

المصدر: 2017 14th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD)

الإتاحة: https://doi.org/10.1109/smacd.2017.7981596Test
http://xplorestagingTest.ieee.org/ielx7/7970054/7981552/07981596.pdf?arnumber=7981596

المؤلفون: Bertani, R., Forzan, M., Sgarbossa, P., Sieni, E., Di Barba, P., SPIZZO, Federico, DEL BIANCO, Lucia

المساهمون: Bertani, R., Forzan, M., Sgarbossa, P., Sieni, E., Di Barba, P., Spizzo, Federico, DEL BIANCO, Lucia

مصطلحات موضوعية: Magnetic fluid hyperthermia, Finite element, optimization

وصف الملف: STAMPA

العلاقة: info:eu-repo/semantics/altIdentifier/wos/WOS:000382950703110; ispartofbook:Industrial Electronics Society, IECON 2015 - 41st Annual Conference of the IEEE; 41st Annual Conference of the IEEE Industrial Electronics Society, IECON 2015; firstpage:3603; lastpage:3608; numberofpages:6; http://hdl.handle.net/11392/2339050Test

الإتاحة: https://doi.org/10.1109/IECON.2015.7392660Test
http://hdl.handle.net/11392/2339050Test