المؤلفون: Dhanya Velmurugan, Arunkumar Arumugam, Cheng-Kai Lin, Crestian Almazan Agustin, Jung-Chieh Chen

المصدر: IEEE Access, Vol 12, Pp 68109-68129 (2024)

مصطلحات موضوعية: ITVV, modulated MFPCC, online duty cycle calculation, SynRM, Electrical engineering. Electronics. Nuclear engineering, TK1-9971

وصف الملف: electronic resource

العلاقة: https://ieeexploreTest.ieee.org/document/10528268/; https://doaj.org/toc/2169-3536Test

الوصول الحر: https://doaj.org/article/8ce0e753a87340b29e6e28362474cd1eTest

المؤلفون: Min-Jie Hsu, Po-Chao Yeh, Yi-Hsing Chien, Cheng-Kai Lu, Wei-Yen Wang, Chen-Chien James Hsu

المصدر: IEEE Access, Vol 11, Pp 25801-25816 (2023)

مصطلحات موضوعية: Chinese calligraphy, hypothesis generation net, image-to-action translation, robotic calligraphy system, Electrical engineering. Electronics. Nuclear engineering, TK1-9971

وصف الملف: electronic resource

العلاقة: https://ieeexploreTest.ieee.org/document/10058944/; https://doaj.org/toc/2169-3536Test

الوصول الحر: https://doaj.org/article/d492ff1ca08e4b8a8045de77a1a5394bTest

المؤلفون: Venkata R. Reddy, Crestian Almazan Agustin, Cheng-Kai Lin, Jung-Chieh Chen

المصدر: IEEE Access, Vol 10, Pp 97856-97867 (2022)

مصطلحات موضوعية: Dual-voltage-vector, modulated model-free predictive current controller, online duty cycle calculation, synchronous reluctance motor, Electrical engineering. Electronics. Nuclear engineering, TK1-9971

وصف الملف: electronic resource

العلاقة: https://ieeexploreTest.ieee.org/document/9888128/; https://doaj.org/toc/2169-3536Test

الوصول الحر: https://doaj.org/article/523ea6c066214e41a2a15cb344fbebf5Test

المؤلفون: Cheng-Kai Lin, Crestian A. Agustin

المصدر: IEEE Open Journal of the Industrial Electronics Society, Vol 3, Pp 537-550 (2022)

مصطلحات موضوعية: Four-switch three-phase inverter (FSTPI), four-voltage-vector, hybrid switching control, model-free predictive current control (MFPCC), synchronous reluctance motor (SynRM), Electronics, TK7800-8360, Industrial engineering. Management engineering, T55.4-60.8

وصف الملف: electronic resource

العلاقة: https://ieeexploreTest.ieee.org/document/9903311/; https://doaj.org/toc/2644-1284Test

الوصول الحر: https://doaj.org/article/4c9f3d9437cf49d68d6e4acb5e72713bTest

المؤلفون: Wang Xue, Cheng Huan-Xin, Sun Sheng-Yi, Jiang Ze-Qin, Cheng Kai, Cheng Li

المصدر: IEEE Access, Vol 10, Pp 34442-34448 (2022)

مصطلحات موضوعية: Rain removal, MSFSA-GAN, self attention, dense block, Electrical engineering. Electronics. Nuclear engineering, TK1-9971

وصف الملف: electronic resource

العلاقة: https://ieeexploreTest.ieee.org/document/9741786/; https://doaj.org/toc/2169-3536Test

الوصول الحر: https://doaj.org/article/77001461c65c4ff1ba446a08c0195e96Test

المؤلفون: Lin, Chih-Wei, Lu, Cheng-Kai, Tang, Tong Boon

المصدر: 2024 10th International Conference on Applied System Innovation (ICASI)

الإتاحة: https://doi.org/10.1109/icasi60819.2024.10547964Test
http://xplorestagingTest.ieee.org/ielx8/10547719/10547721/10547964.pdf?arnumber=10547964

المؤلفون: Chang, Po-Hsiang, Lu, Cheng-Kai, Tang, Tong Boon, Lin, Chih-Wei

المصدر: 2024 10th International Conference on Applied System Innovation (ICASI)

الإتاحة: https://doi.org/10.1109/icasi60819.2024.10547762Test
http://xplorestagingTest.ieee.org/ielx8/10547719/10547721/10547762.pdf?arnumber=10547762

المؤلفون: Cheng, Kai-Wen, Liu, You-Jin, Hsieh, E Ray

المصدر: 2024 International VLSI Symposium on Technology, Systems and Applications (VLSI TSA)

الإتاحة: https://doi.org/10.1109/vlsitsa60681.2024.10546464Test
http://xplorestagingTest.ieee.org/ielx8/10546337/10546338/10546464.pdf?arnumber=10546464

المؤلفون: Chiu, Shao-Chien, Peng, Mark, Wei, Yuan-Chung, Cheng, Kai-Yuan, Chen, To-Yu, Chou, Heng-Yu, Wu, Meng-Che, Su, Kuan Hua, Shushan, Nofar, Mizrahi, Assaf, Maurya, Sidharth, Danieli, Guy, Reut, Gilad

المصدر: 2024 35th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC)

الإتاحة: https://doi.org/10.1109/asmc61125.2024.10545367Test
http://xplorestagingTest.ieee.org/ielx8/10545359/10545360/10545367.pdf?arnumber=10545367

المؤلفون: Yang, Chunhui, Zhang, Weijiao, Cheng, Kai, Li, Chaoxu

المصدر: 2024 IEEE 3rd International Conference on Electrical Engineering, Big Data and Algorithms (EEBDA)

الإتاحة: https://doi.org/10.1109/eebda60612.2024.10485855Test
http://xplorestagingTest.ieee.org/ielx7/10485650/10485652/10485855.pdf?arnumber=10485855