المؤلفون: Peebles, M., Barnett, J. J., Duke, M., Lim, S. H.

المصدر: 2020 IEEE 16th International Conference on Automation Science and Engineering (CASE)

الإتاحة: https://doi.org/10.1109/case48305.2020.9217006Test
http://xplorestagingTest.ieee.org/ielx7/9210430/9216730/09217006.pdf?arnumber=9217006

المؤلفون: Loh, W.-Y, Wang, W.-E, Hill, R. J. W., Barnett, J., Yum, J. H., Lysagth, P., Price, J., Hung, P. Y., Kirsch, P. D., Jammy, R.

المصدر: 2013 International Symposium on VLSI Technology, Systems and Application (VLSI-TSA)

الإتاحة: https://doi.org/10.1109/vlsi-tsa.2013.6545610Test
http://xplorestagingTest.ieee.org/ielx7/6530992/6545273/06545610.pdf?arnumber=6545610

المؤلفون: Ang, K.-W., Barnett, J., Loh, W.-Y., Huang, J., Min, B.-G., Hung, P. Y., Ok, I., Yum, J. H., Bersuker, G., Rodgers, M., Kaushik, V., Gausepohl, S., Hobbs, C., Kirsch, P. D., Jammy, R.

المصدر: 2011 International Electron Devices Meeting

الإتاحة: https://doi.org/10.1109/iedm.2011.6131679Test
http://xplorestagingTest.ieee.org/ielx5/6123666/6131464/06131679.pdf?arnumber=6131679

المؤلفون: Felch, S., Hobbs, C., Barnett, J., Etienne, H., Duchaine, J., Rodgers, M., Bennett, S., Torregrosa, F., Spiegel, Y., Roux, L.

المصدر: 11th International Workshop on Junction Technology (IWJT)

الإتاحة: https://doi.org/10.1109/iwjt.2011.5969992Test
http://xplorestagingTest.ieee.org/ielx5/5958193/5969986/05969992.pdf?arnumber=5969992

المؤلفون: Hill, R. J. W., Baraskar, A., Park, C., Barnett, J., Majhi, P., Jammy, R.

المصدر: 2010 IEEE International SOI Conference (SOI)

الإتاحة: https://doi.org/10.1109/soi.2010.5641048Test
http://xplorestagingTest.ieee.org/ielx5/5629482/5641025/05641048.pdf?arnumber=5641048

المؤلفون: Hill, R. J. W., Park, C., Barnett, J., Price, J., Huang, J., Goel, N., Loh, W.Y., Oh, J., Smith, C. E., Kirsch, P., Majhi, P., Jammy, R.

المصدر: 2010 International Electron Devices Meeting

الإتاحة: https://doi.org/10.1109/iedm.2010.5703307Test
http://xplorestagingTest.ieee.org/ielx5/5692854/5703218/05703307.pdf?arnumber=5703307

المؤلفون: Oh, J., Lee, S.-H., Min, K.-S., Huang, J., Min, B.G., Sassman, B., Jeon, K., Loh, W.-Y., Barnett, J., Ok, I., Kang, C.-Y., Smith, C., Ko, D.-H., Kirsch, P. D., Jammy, R.

المصدر: 2010 Symposium on VLSI Technology

الإتاحة: https://doi.org/10.1109/vlsit.2010.5556127Test
http://xplorestagingTest.ieee.org/ielx5/5548927/5556114/05556127.pdf?arnumber=5556127

المؤلفون: Gilmer, D. C., Goel, N., Park, H., Park, C., Barnett, J., Kirsch, P. D., Jammy, R.

المصدر: 2009 IEEE International Memory Workshop

الإتاحة: https://doi.org/10.1109/imw.2009.5090594Test
http://xplorestagingTest.ieee.org/ielx5/5090563/5090564/05090594.pdf?arnumber=5090594

المؤلفون: Park, C. S., Yang, J. W., Hussain, M. M., Kang, C. Y., Huang, J., Sivasubramani, P., Park, C., Tateiwa, K., Harada, Y., Barnett, J., Melvin, C., Bersuker, G., Kirsch, P. D., Lee, B. H., Tseng, H. H., Jammy, R.

المصدر: 2009 International Symposium on VLSI Technology, Systems, and Applications

الإتاحة: https://doi.org/10.1109/vtsa.2009.5159290Test
http://xplorestagingTest.ieee.org/ielx5/5129138/5159260/05159290.pdf?arnumber=5159290

المؤلفون: Young, C.D., Heh, D., Choi, R., Peterson, J.J., Barnett, J., Lee, B.H., Zeitzoff, P., Brown, G.A., Bersuker, G.

المصدر: 2006 International Symposium on VLSI Technology, Systems, and Applications

الإتاحة: https://doi.org/10.1109/vtsa.2006.251089Test
http://xplorestagingTest.ieee.org/ielx5/4016578/4016579/04016625.pdf?arnumber=4016625