المؤلفون: Titus, Peter¹ (AUTHOR) ptitus@pppl.gov, Zhang, Han¹ (AUTHOR), Raftopoulos, S.¹ (AUTHOR), Schneider, Hans¹ (AUTHOR), Freeman, C.¹ (AUTHOR), Rozenblat, R.¹ (AUTHOR), Dong, J.¹ (AUTHOR), Zimmer, G.¹ (AUTHOR), Tchillinguirian, G.¹ (AUTHOR)

المصدر: IEEE Transactions on Plasma Science. Aug2019, Vol. 47 Issue 8, p4165-4169. 5p.

مصطلحات موضوعية: BENDING stresses, STRUCTURAL health monitoring, SHEARING force, MECHANICAL failures, MACHINE performance

المؤلفون: Jiang, Wei¹ (AUTHOR), Wang, Mingxiang¹ (AUTHOR) mingxiang_wang@suda.edu.cn, Wang, Huaisheng¹ (AUTHOR), Zhang, Dongli¹ (AUTHOR)

المصدر: IEEE Transactions on Electron Devices. May2019, Vol. 66 Issue 5, p2214-2218. 5p.

مصطلحات موضوعية: BENDING stresses, INDIUM gallium zinc oxide, THIN film transistors, THRESHOLD voltage

المؤلفون: Nabias, Julie¹, Asfour, Aktham¹, Yonnet, Jean-Paul¹

المصدر: IEEE Transactions on Magnetics. Nov2017, Vol. 53 Issue 11, p1-8. 8p.

مصطلحات موضوعية: BENDING stresses, ELECTRIC current measurement, MAGNETIC sensors, MAGNETIC fields, MAGNETIC materials

المؤلفون: Zheng, Yu-Zhe, Chen, Po-Hsun, Chang, Ting-Chang, Tsai, Tsung-Ming, Zhou, Kuan-Ju, Tu, Yu-Fa, Wang, Yu-Xuan, Wu, Chia-Chuan, Chen, Yu-An, Sun, Pei-Jun, Chen, Juan-Jie, Tu, Hong-Yi, Hung, Yang-Hao, Lin, Yu-Shan, Ciou, Fong-Min, Shih, Yu-Shan, Huang, Hui-Chun

المصدر: IEEE Transactions on Electron Devices; May2022, Vol. 69 Issue 5, p2423-2429, 7p

مصطلحات موضوعية: POLYCRYSTALLINE silicon, THIN film transistors, BENDING stresses, SILICON films, GAS flow, X-ray spectroscopy, STRAINS & stresses (Mechanics)

المؤلفون: Wu, Jinguo, Yang, Bin, Zhou, Pan, Wen, Shaobo, Lin, Qinghua

المصدر: IEEE Transactions on Plasma Science; Apr2022, Vol. 50 Issue 4, p1018-1025, 8p

مصطلحات موضوعية: LIVE loads, CRITICAL velocity, BENDING stresses, PACKAGING design

المؤلفون: Du, Mengjun, Li, Bin, Zhou, Wenjuan, Wang, Mingxiang, Zhang, Dongli, Wang, Huaisheng, Shan, Qi

المصدر: IEEE Electron Device Letters; Nov2021, Vol. 42 Issue 11, p1627-1630, 4p

مصطلحات موضوعية: BENDING stresses, THIN film transistors, INDIUM gallium zinc oxide, POLYCRYSTALLINE silicon, ELECTRON capture, THRESHOLD voltage, ELECTRON transport

المؤلفون: Kumar, Mithlesh, Guarino, Roberto, Sedlak, Kamil, Sarasola, Xabier, Bruzzone, Pierluigi

المصدر: IEEE Transactions on Applied Superconductivity; Jun2021, Vol. 31 Issue 4, p1-5, 5p

مصطلحات موضوعية: PRESSURE drop (Fluid dynamics), BENDING stresses, SUPERCONDUCTING magnets, MAGNETIC fields, PLASMA temperature

الشركة/الكيان: EUROPEAN Union

المؤلفون: Ki Sung Chang¹, Dong Keun Park¹, Seong Eun Yang¹, Hyun Chul Jo¹, Hyung Jun Kim¹, Yong Soo Yoon² ysyoon@ansantc.ac.kr, Hyun Sung Kim³, Haigun Lee³ haigunlee@korea.ac.kr, Tae Kuk Ko¹ tkko@yonsei.ac.kr

المصدر: IEEE Transactions on Applied Superconductivity. Jun2010, Vol. 20 Issue 3, p1577-1580. 4p.

مصطلحات موضوعية: ELECTRICAL conductors, BENDING stresses, SOLDER & soldering, SUPERCONDUCTIVITY, MAGNETIC tapes

المؤلفون: Mercado, Lei L.¹ llmercado@ieee.org, Phillips, Betty², Sahasrabudhe, Shubhada², Sedillo, Joe Paul², Bray, David², Monroe, Eric², Kang Joon Lee³, Lo, George³

المصدر: IEEE Transactions on Advanced Packaging. May2006, Vol. 29 Issue 2, p240-249. 10p. 3 Black and White Photographs, 10 Diagrams, 1 Chart, 8 Graphs.

مصطلحات موضوعية: *CELL phones, *POCKET computers, *FINITE element method, BENDING stresses, ELECTRONIC circuit design, ACCELERATED life testing, PRINTED circuits

المؤلفون: Chang, Yeong-Hwa¹, Hsu, Chang-Hung², Chu, Huei-Lung³, Tseng, Ching-Pei⁴

المصدر: IEEE Transactions on Magnetics. Oct2011, Vol. 47 Issue 10, p2776-2779. 4p.

مصطلحات موضوعية: BENDING stresses, ELECTRIC transformers, X-ray diffraction, MAGNETOSTRICTION, MICROSTRUCTURE, MAGNETIC fields, ANISOTROPY