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1مؤتمر
المؤلفون: Huang, Neng, Shao, Zhiyuan, Jin, Hai
المساهمون: Services Computing Technology and System Lab HUST, Huazhong University of Science and Technology Wuhan (HUST), School of Computer Science and Technology, Ching-Hsien Hsu, Xiaoming Li, Xuanhua Shi, Ran Zheng
المصدر: Lecture Notes in Computer Science ; 10th International Conference on Network and Parallel Computing (NPC) ; https://hal.inria.fr/hal-01513753Test ; 10th International Conference on Network and Parallel Computing (NPC), Sep 2013, Guiyang, China. pp.49-60, ⟨10.1007/978-3-642-40820-5_5⟩
مصطلحات موضوعية: Concurrency, Data Race, Sampling, Bug Detection, [INFO]Computer Science [cs]
العلاقة: hal-01513753; https://hal.inria.fr/hal-01513753Test; https://hal.inria.fr/hal-01513753/documentTest; https://hal.inria.fr/hal-01513753/file/978-3-642-40820-5_5_Chapter.pdfTest
الإتاحة: https://doi.org/10.1007/978-3-642-40820-5_5Test
https://hal.inria.fr/hal-01513753Test
https://hal.inria.fr/hal-01513753/documentTest
https://hal.inria.fr/hal-01513753/file/978-3-642-40820-5_5_Chapter.pdfTest -
2مؤتمر
المؤلفون: Huang, Neng, Shao, Zhiyuan, Jin, Hai
المساهمون: Services Computing Technology and System Lab HUST, Huazhong University of Science and Technology Wuhan (HUST), School of Computer Science and Technology, Ching-Hsien Hsu, Xiaoming Li, Xuanhua Shi, Ran Zheng
المصدر: Lecture Notes in Computer Science ; 10th International Conference on Network and Parallel Computing (NPC) ; https://hal.inria.fr/hal-01513753Test ; 10th International Conference on Network and Parallel Computing (NPC), Sep 2013, Guiyang, China. pp.49-60, ⟨10.1007/978-3-642-40820-5_5⟩
مصطلحات موضوعية: Concurrency, Data Race, Sampling, Bug Detection, [INFO]Computer Science [cs]
العلاقة: hal-01513753; https://hal.inria.fr/hal-01513753Test; https://hal.inria.fr/hal-01513753/documentTest; https://hal.inria.fr/hal-01513753/file/978-3-642-40820-5_5_Chapter.pdfTest
الإتاحة: https://doi.org/10.1007/978-3-642-40820-5_5Test
https://hal.inria.fr/hal-01513753Test
https://hal.inria.fr/hal-01513753/documentTest
https://hal.inria.fr/hal-01513753/file/978-3-642-40820-5_5_Chapter.pdfTest -
3مؤتمر
المؤلفون: Chiu, Li-Jia, Huang, Neng-Tang
المساهمون: National Taiwan Normal University (NTNU), James J. Park, Albert Zomaya, Sang-Soo Yeo, Sartaj Sahni, TC 10, WG 10.3
المصدر: Lecture Notes in Computer Science ; 9th International Conference on Network and Parallel Computing (NPC) ; https://hal.inria.fr/hal-01551317Test ; 9th International Conference on Network and Parallel Computing (NPC), Sep 2012, Gwangju, South Korea. pp.394-400, ⟨10.1007/978-3-642-35606-3_46⟩
مصطلحات موضوعية: Internal auditors, personal attributes, demographic variables, [INFO]Computer Science [cs]
جغرافية الموضوع: Gwangju, South Korea
العلاقة: hal-01551317; https://hal.inria.fr/hal-01551317Test; https://hal.inria.fr/hal-01551317/documentTest; https://hal.inria.fr/hal-01551317/file/978-3-642-35606-3_46_Chapter.pdfTest
الإتاحة: https://doi.org/10.1007/978-3-642-35606-3_46Test
https://hal.inria.fr/hal-01551317Test
https://hal.inria.fr/hal-01551317/documentTest
https://hal.inria.fr/hal-01551317/file/978-3-642-35606-3_46_Chapter.pdfTest -
4مؤتمر
المؤلفون: Chiu, Li-Jia, Huang, Neng-Tang
المساهمون: National Taiwan Normal University (NTNU), James J. Park, Albert Zomaya, Sang-Soo Yeo, Sartaj Sahni, TC 10, WG 10.3
المصدر: Lecture Notes in Computer Science ; 9th International Conference on Network and Parallel Computing (NPC) ; https://hal.inria.fr/hal-01551317Test ; 9th International Conference on Network and Parallel Computing (NPC), Sep 2012, Gwangju, South Korea. pp.394-400, ⟨10.1007/978-3-642-35606-3_46⟩
مصطلحات موضوعية: Internal auditors, personal attributes, demographic variables, [INFO]Computer Science [cs]
جغرافية الموضوع: Gwangju, South Korea
العلاقة: hal-01551317; https://hal.inria.fr/hal-01551317Test; https://hal.inria.fr/hal-01551317/documentTest; https://hal.inria.fr/hal-01551317/file/978-3-642-35606-3_46_Chapter.pdfTest
الإتاحة: https://doi.org/10.1007/978-3-642-35606-3_46Test
https://hal.inria.fr/hal-01551317Test
https://hal.inria.fr/hal-01551317/documentTest
https://hal.inria.fr/hal-01551317/file/978-3-642-35606-3_46_Chapter.pdfTest
