المؤلفون: Gaioni L., Manghisoni M., Re V., Speziali V., Traversi G., RATTI, LODOVICO

المساهمون: Gaioni, L., Manghisoni, M., Ratti, Lodovico, Re, V., Speziali, V., Traversi, G.

مصطلحات موضوعية: deep submicron CMOS, gate current, shot noise, flicker noise

وصف الملف: STAMPA

العلاقة: info:eu-repo/semantics/altIdentifier/isbn/9789290833246; ispartofbook:Proceedings of the Topical Workshop on Electronics for Particle Physics, TWEPP 2008; Topical Workshop on Electronics for Particle Physics, TWEPP 2008; firstpage:436; lastpage:440; numberofpages:5; http://hdl.handle.net/11571/134956Test; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-84877708527

الإتاحة: http://hdl.handle.net/11571/134956Test

المؤلفون: Gaioni, L., Massimo Manghisoni, Ratti, L., Re, V., Speziali, V., Traversi, G.

المصدر: Scopus-Elsevier

مصطلحات موضوعية: nanodevices, microelectronics, Hardware_INTEGRATEDCIRCUITS, Hardware_PERFORMANCEANDRELIABILITY, Detectors and Experimental Techniques, sensors, Hardware_LOGICDESIGN

الوصول الحر: https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::1ee7589747bb8b5c373f76f5abeee747Test
http://hdl.handle.net/10446/22113Test

المؤلفون: Gaioni, L, Manghisoni, M, Ratti, L, Re, V, Speziali, V, Traversi, G

مصطلحات موضوعية: Detectors and Experimental Techniques

العلاقة: http://cdsTest.cern.ch/record/1159533; oai:cds.cern.ch:1159533

الإتاحة: https://doi.org/10.5170Test/CERN-2008-008.436
http://cdsTest.cern.ch/record/1159533