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المؤلفون: D. J. Johnson, Paola Atkinson, Neil J. Curson, Donald A. MacLaren, William Allison, Bodil Holst
المصدر: Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films. 20:285-287
مصطلحات موضوعية: Silicon, Passivation, Hydrogen, chemistry.chemical_element, Nanotechnology, Surfaces and Interfaces, Condensed Matter Physics, Oxygen, Surfaces, Coatings and Films, Crystal, chemistry, Chemical engineering, Scientific method, Microscopy, Inert gas
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::5d586f92140e5eee2b8f8b33d205d01dTest
https://doi.org/10.1116/1.1419084Test -
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المؤلفون: Marc J.-F. Suter, M. Döbeli, H. Fuhrmann, R. Mühle
المصدر: Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures. 17:945
مصطلحات موضوعية: Materials science, Silicon, Hydrogen, Passivation, business.industry, General Engineering, chemistry.chemical_element, Heterojunction, Nanotechnology, Focused ion beam, Fluence, Resist, chemistry, Etching (microfabrication), Optoelectronics, business
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::9cb11cadd3706089a930d06a238876acTest
https://doi.org/10.1116/1.590674Test -
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المؤلفون: H. Choi, G. C. Abeln, S. T. Hwang, Mark C. Hersam, Jeffrey S. Moore, D. S. Thompson, Joseph W. Lyding
المصدر: Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures. 16:3874
مصطلحات موضوعية: Materials science, Passivation, Hydrogen, Silicon, General Engineering, chemistry.chemical_element, Nanotechnology, Chemical vapor deposition, law.invention, Reaction rate, chemistry, Chemical engineering, Chemisorption, law, Monolayer, Scanning tunneling microscope
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::073c96c9f5b4b9ef72d6eb6eb5c777cdTest
https://doi.org/10.1116/1.590426Test -
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المؤلفون: L. Howald, M. Guggisberg, H.-J. Güntherodt, L. Scandella, Jens Gobrecht, R. Lüthi, Ernst Meyer
المصدر: Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures. 14:1255
مصطلحات موضوعية: Materials science, integumentary system, Silicon, Hydrogen, Passivation, Silicon dioxide, technology, industry, and agriculture, General Engineering, chemistry.chemical_element, Nitrogen atmosphere, Nanotechnology, equipment and supplies, complex mixtures, body regions, chemistry.chemical_compound, chemistry, Low load, Scanning Force Microscopy, Composite material, Contact area
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::d6893c515879fa49b596e504a6bc8e2eTest
https://doi.org/10.1116/1.588526Test -
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المؤلفون: T. C. Shen, Joseph W. Lyding, J. R. Tucker, G. C. Abeln, C. Wang
المصدر: T.-C. Shen
مصطلحات موضوعية: Nanostructure, Materials science, Passivation, Silicon, Hydrogen, oxidation, business.industry, Physics, General Engineering, silicon, chemistry.chemical_element, Nanotechnology, law.invention, Field electron emission, Nanolithography, tunneling microscope, chemistry, Resist, law, nanometer, Optoelectronics, vacuum scanning, Scanning tunneling microscope, business
وصف الملف: application/pdf
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::4508077bb23a3d96acfdaa538c80605aTest
https://doi.org/10.1116/1.587433Test