Obtaining the scattering rate of different Tc0 FeSe thin films via spectroscopic ellipsometry
| العنوان: | Obtaining the scattering rate of different Tc0 FeSe thin films via spectroscopic ellipsometry |
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| المؤلفون: | Jiaxiong Fang, Minglin Zhao, Kui Jin, QingFen Jiang, Jie Lian, MingYang Wei, Yujun Shi, Zhongpei Feng, Kai Dai, Haonan Song |
| المصدر: | Journal of Vacuum Science & Technology B. 37:052907 |
| بيانات النشر: | American Vacuum Society, 2019. |
| سنة النشر: | 2019 |
| مصطلحات موضوعية: | 010302 applied physics, Superconductivity, Materials science, Condensed matter physics, Process Chemistry and Technology, 02 engineering and technology, Substrate (electronics), 021001 nanoscience & nanotechnology, 01 natural sciences, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, Pulsed laser deposition, Lattice constant, Scattering rate, 0103 physical sciences, Materials Chemistry, Electrical and Electronic Engineering, Thin film, 0210 nano-technology, Instrumentation, Refractive index, Single crystal |
| الوصف: | Due to the simplest crystalline structure among Fe-based superconductors, the FeSe system has attracted a lot of attention. In this work, FeSe thin films grown on the CaF2 substrate with Tc0 = 6 and 11 K (named FeSe_1 and FeSe_2, respectively) are fabricated by a pulsed laser deposition technique. X-ray diffraction exhibits a high-quality single crystal of the two FeSe samples, and the lattice constants are about 5.574 A. Atomic force microscopy characterizes their surface topography and roughness, which shows stripes in their surfaces that is helpful to construct a roughness layer using the optical measurement spectroscopic ellipsometry (SE) technique. SE is a powerful tool to determine FeSe thin films’ complex refractive index N = n + i k and plasma oscillation frequency ω p. These important parameters are related to scattering rate τ − 1 for FeSe thin films. The results show that scattering rate τ − 1 of FeSe_2 is significantly lower than that of FeSe_1 in the whole frequency testing range at room temperature, which may be the reason that FeSe_2 owns higher Tc0 in low temperature than FeSe_1.Due to the simplest crystalline structure among Fe-based superconductors, the FeSe system has attracted a lot of attention. In this work, FeSe thin films grown on the CaF2 substrate with Tc0 = 6 and 11 K (named FeSe_1 and FeSe_2, respectively) are fabricated by a pulsed laser deposition technique. X-ray diffraction exhibits a high-quality single crystal of the two FeSe samples, and the lattice constants are about 5.574 A. Atomic force microscopy characterizes their surface topography and roughness, which shows stripes in their surfaces that is helpful to construct a roughness layer using the optical measurement spectroscopic ellipsometry (SE) technique. SE is a powerful tool to determine FeSe thin films’ complex refractive index N = n + i k and plasma oscillation frequency ω p. These important parameters are related to scattering rate τ − 1 for FeSe thin films. The results show that scattering rate τ − 1 of FeSe_2 is significantly lower than that of FeSe_1 in the whole frequency testing range... |
| تدمد: | 2166-2754 2166-2746 |
| الوصول الحر: | https://explore.openaire.eu/search/publication?articleId=doi_________::6a07b8f15e34697091f6892934b23af3Test https://doi.org/10.1116/1.5119394Test |
| رقم الانضمام: | edsair.doi...........6a07b8f15e34697091f6892934b23af3 |
| قاعدة البيانات: | OpenAIRE |
| تدمد: | 21662754 21662746 |
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