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1دورية أكاديمية
المؤلفون: Musa Adesola Bawallah, Stephen Olubusola Ilugbo, Kesyton Oyamenda Ozegin, Babatunde A Adebo, Isaac Aigbedion, Kazeem Adeyinka Salako
المصدر: Indonesian Journal of Earth Sciences, Vol 1, Iss 2 (2021)
مصطلحات موضوعية: Geotechnical Studies, 2D ERT, Lateral Horizontal Profiling, VES, Vulnerability Factor, Structural Integrity, envir, archi
الإتاحة: https://doi.org/10.52562/injoes.v1i2.253Test
https://doaj.org/article/dc1bdea605df486dbeca6bc1c0f86ea0Test -
2دورية أكاديمية
المؤلفون: Wang, Shuai
المصدر: Dissertations
مصطلحات موضوعية: Computer architecture, Reliability, Soft error, Cache, Register file, Temporal vulnerability factor, Computer Engineering
وصف الملف: application/pdf
العلاقة: https://digitalcommons.njit.edu/dissertations/207Test; https://digitalcommons.njit.edu/cgi/viewcontent.cgi?article=1262&context=dissertationsTest
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3مؤتمر
المؤلفون: Rodopoulos, Dimitrios, Corbetta, S., Massari, Giuseppe, Libutti, S., Catthoor, F., Sazeides, Yiannakis, Nicopoulos, Chrysostomos A., Portero, Antoni, Cappe, E., Vavrík, R., Vondrák, V., Soudris, Dimitrios J., Sassi, F., Fritsch, A., Fornaciari, W.
المساهمون: Carro L., Soudris, Dimitrios J., Nicopoulos, Chrysostomos A. 0000-0001-6389-6068
المصدر: Proceedings - 2015 International Conference on Embedded Computer Systems: Architectures, Modeling and Simulation, SAMOS 2015 ; 15th International Conference on Embedded Computer Systems: Architectures, Modeling and Simulation, SAMOS 2015 ; https://www.scopus.com/inward/record.uri?eid=2-s2.0-84963701941&doi=10.1109%2fSAMOS.2015.7363685&partnerID=40&md5=0bf7367dcb437a7117a9044e4d2d8f8eTest
مصطلحات موضوعية: Computer architecture, Embedded systems, Degradation, Vulnerability factors, Dynamic frequency scaling, Dynamic Voltage and Frequency Scaling, Embedded Computing, High Performance Computing, Performance Vulnerability Factor, Resource Management, Transistors, Variability, Voltage scaling
الإتاحة: https://doi.org/10.1109/SAMOS.2015.7363685Test
http://gnosis.library.ucy.ac.cy/handle/7/54899Test -
4مؤتمر
المؤلفون: Lee, Jongeun, Shrivastava, Aviral
مصطلحات موضوعية: Architectural vulnerability factor, Compilation, Embedded system, Link-time optimization, Register file, Soft error, Static analysis
العلاقة: ACM SIGPLAN Conference on Languages, Compilers and Tools for Embedded Systems, pp.41 - 49; https://scholarworks.unist.ac.kr/handle/201301/32411Test; 3127; 2-s2.0-70450285520; https://dl.acm.org/citation.cfm?id=1542459Test
الإتاحة: https://doi.org/10.1145/1542452.1542459Test
https://scholarworks.unist.ac.kr/handle/201301/32411Test
https://dl.acm.org/citation.cfm?id=1542459Test -
5دورية أكاديمية
المؤلفون: Can, Serdarzafer, Yalcin, Gulay, Ergin, Oguz, Unsal, Osman, Cristal, Adrian
المساهمون: The Scientific and Technological Research Council of Turkey
مصطلحات موضوعية: Vulnerability, Soft errors, Fault injection, Architectural vulnerability factor, manag, archi
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6دورية أكاديمية
المؤلفون: Can, Serdarzafer, Yalcin, Gulay, Ergin, Oguz, Unsal, Osman, Cristal, Adrian
المساهمون: The Scientific and Technological Research Council of Turkey
مصطلحات موضوعية: Vulnerability, Soft errors, Fault injection, Architectural vulnerability factor
العلاقة: Sí; Microprocessors and Microsystems 38 (6): 598- 604 (2014); http://hdl.handle.net/10261/132354Test
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7دورية أكاديمية
المؤلفون: Shah, Ronak, Choi, Minsu, Jang, Byunghyun
المصدر: Electrical and Computer Engineering Faculty Research & Creative Works
مصطلحات موضوعية: Computer Graphics, Computer Simulation, Monte Carlo Methods, Personal Computers, Program Processors, Architectural Vulnerability Factor, Error Correction Codes, Fault Sensitivity, General Purpose Computing on GPU, General-Purpose Computing, Graphics Processing Unit, High Performance Computing, Monte-Carlo Simulations, Computer Graphics Equipment, Electrical and Computer Engineering
العلاقة: https://scholarsmine.mst.edu/ele_comeng_facwork/3200Test; https://doi.org/10.1109/SAMOS.2013.6621134Test
الإتاحة: https://doi.org/10.1109/SAMOS.2013.6621134Test
https://scholarsmine.mst.edu/ele_comeng_facwork/3200Test -
8رسالة جامعية
المؤلفون: Toomey, Corey Thomas
مصطلحات موضوعية: Register Transfer Level, Fault Injection, Architectural Vulnerability Factor, Soft Errors, Single Event, Verilog Procedural Interface, Statistical Fault Injection
وصف الملف: application/pdf