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1دورية أكاديمية
المؤلفون: Aharon, Udi, Marbel, Revital, Dubin, Ran, Dvir, Amit, Hajaj, Chen
مصطلحات موضوعية: Cryptography and Security cs.CR, FOS Computer and information sciences
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2دورية أكاديمية
المؤلفون: Potorti, Francesco, Park, Sangjoon, Crivello, Antonino, Palumbo, Filippo, Girolami, Michele, Barsocchi, Paolo, Lee, Soyeon, Torres-Sospedra, Joaquin, Ruiz, Antonio Ramon Jimenez, Perez-Navarro, Antoni, Mendoza-Silva, German Martin, Seco, Fernando, Ortiz, Miguel, Perul, Johan, Renaudin, Valerie, Kang, Hyunwoong, Park, Soyoung, Lee, Jae Hong, Park, Chan Gook, Ha, Jisu, Han, Jaeseung, Park, Changjun, Kim, Keunhye, Lee, Yonghyun, Gye, Seunghun, Lee, Keumryeol, Kim, Eunjee, Choi, Jeong-Sik, Choi, Yang-Seok, Talwar, Shilpa, Cho, Seong Yun, Ben-Moshe, Boaz, Scherbakov, Alex, Antsfeld, Leonid, Sansano-Sansano, Emilio, Chidlovskii, Boris, Kronenwett, Nikolai, Prophet, Silvia, Landay, Yael, Marbel, Revital, Zheng, Lingxiang, Peng, Ao, Lin, Zhichao, Wu, Bang, Ma, Chengqi, Poslad, Stefan, Selviah, David R., Wu, Wei, Ma, Zixiang, Zhang, Wenchao
المساهمون: Fundao para a Cincia e Tecnologia, Ministry of Science and Technology, Institute for Information and communications Technology PromotionIITP grant funded by the Korea government MSIT, Basic Science Research Program through the National Research Foundation of Korea NRF funded by the Ministry of Science, MSIT Ministry of Science and ICT Korea under the ITRC, Agentúra na Podporu Výskumu a Vývoja, Strategic Priority Research Program, Korea government NFA, ICT R and D Program of MSIPIITP, Ministerio de Ciencia e Innovacin, JSPS KAKENHI
المصدر: IEEE Access ; volume 8, page 206674-206718 ; ISSN 2169-3536
الإتاحة: https://doi.org/10.1109/access.2020.3037221Test
http://xplorestaging.ieee.org/ielx7/6287639/8948470/09253514.pdf?arnumber=9253514Test -
3دورية أكاديمية
المؤلفون: Renaudin, Valerie, Ortiz, Miguel, Perul, Johan, Torres-Sospedra, Joaquin, Jimenez, Antonio Ramon, Perez-Navarro, Antoni, Martin Mendoza-Silva, German, Seco, Fernando, Landau, Yael, Marbel, Revital, Ben-Moshe, Boaz, Zheng, Xingyu, Ye, Feng, Kuang, Jian, Li, Yu, Niu, Xiaoji, Landa, Vlad, Hacohen, Shlomi, Shvalb, Nir, Lu, Chuanhua, Uchiyama, Hideaki, Thomas, Diego, Shimada, Atsushi, Taniguchi, Rin-Ichiro, Ding, Zhenxing, Xu, Feng, Kronenwett, Nikolai, Vladimirov, Blagovest, Lee, Soyeon, Cho, Eunyoung, Jun, Sungwoo, Lee, Changeun, Park, Sangjoon, Lee, Yonghyun, Rew, Jehyeok, Park, Changjun, Jeong, Hyeongyo, Han, Jaeseung, Lee, Keumryeol, Zhang, Wenchao, Li, Xianghong, Wei, Dongyan, Zhang, Ying, Park, So Young, Park, Chan Gook, Knauth, Stefan, Pipelidis, Georgios, Tsiamitros, Nikolaos, Lungenstrass, Tomas, Morales, Juan Pablo
المصدر: IEEE Access ; volume 7, page 148594-148628 ; ISSN 2169-3536
الإتاحة: https://doi.org/10.1109/access.2019.2944389Test
http://xplorestaging.ieee.org/ielx7/6287639/8600701/08852722.pdf?arnumber=8852722Test -
4مؤتمر
المؤلفون: Ben-Moshe, Boaz, Landau, Yael, Marbel, Revital, Mishiner, Aviv
المصدر: 2018 IEEE International Conference on the Science of Electrical Engineering in Israel (ICSEE)
الإتاحة: https://doi.org/10.1109/icsee.2018.8645997Test
http://xplorestaging.ieee.org/ielx7/8643018/8645960/08645997.pdf?arnumber=8645997Test -
5مؤتمر
المؤلفون: Marbel, Revital, Ben-Moshe, Boaz, Yozevitch, Roi
المصدر: 2016 IEEE International Conference on the Science of Electrical Engineering (ICSEE)
الإتاحة: https://doi.org/10.1109/icsee.2016.7806068Test
http://xplorestaging.ieee.org/ielx7/7794366/7806027/07806068.pdf?arnumber=7806068Test