المؤلفون: Rink, Sven, Kammerer, Jean-Baptiste, Quenette, Vincent, Uhring, Wilfried, Gouget, Gilles, Manouvrier, Jean-Robert, Lallement, Christophe

المساهمون: European Government initiative through the Important Project of European Interest (IPCEI) Project “Nano2022” aiming to redynamize the European Semiconductor Industry

المصدر: IEEE Transactions on Electron Devices ; volume 71, issue 1, page 331-336 ; ISSN 0018-9383 1557-9646

مصطلحات موضوعية: Electrical and Electronic Engineering, Electronic, Optical and Magnetic Materials

الإتاحة: https://doi.org/10.1109/ted.2023.3311423Test
http://xplorestaging.ieee.org/ielx7/16/10382412/10251090.pdf?arnumber=10251090Test

المؤلفون: Ghoulam, Yasser, Pavot, Thomas, Mamouri, Lakhdar, Mesbahi, Tedjani, Durand, Sylvain, Lallement, Christophe, Kiefer, Renaud, Laroche, Edouard

المصدر: 2022 IEEE Vehicle Power and Propulsion Conference (VPPC)

الإتاحة: https://doi.org/10.1109/vppc55846.2022.10003404Test
http://xplorestaging.ieee.org/ielx7/10003263/10003224/10003404.pdf?arnumber=10003404Test

المؤلفون: Bonament, Alexi, Prel, Alexis, Sallese, Jean-Michel, Lallement, Christophe, Madec, Morgan

المصدر: http://infoscience.epfl.ch/record/292999Test.

العلاقة: isi:000755773600006; http://infoscience.epfl.ch/record/292999Test

الإتاحة: https://doi.org/10.3934/mbe.2022179Test
http://infoscience.epfl.ch/record/292999Test

المؤلفون: Bonament, Alexi, Madec, Morgan, Lallement, Christophe

المساهمون: European Regional Development Fund, Interreg

المصدر: 2021 IEEE International Symposium on Circuits and Systems (ISCAS)

الإتاحة: https://doi.org/10.1109/iscas51556.2021.9401396Test
http://xplorestaging.ieee.org/ielx7/9401028/9401051/09401396.pdf?arnumber=9401396Test

المؤلفون: Bonament, Alexi, Prel, Alexis, Sallese, Jean-Michel, Madec, Morgan, Lallement, Christophe

المصدر: 2020 27th International Conference on Mixed Design of Integrated Circuits and System (MIXDES)

الإتاحة: https://doi.org/10.23919/mixdes49814.2020.9155997Test
http://xplorestaging.ieee.org/ielx7/9145771/9155558/09155997.pdf?arnumber=9155997Test

المؤلفون: Bonament, Alexi, Prel, Alexis, Sallese, Jean-Michel, Madec, Morgan, Lallement, Christophe

المصدر: http://infoscience.epfl.ch/record/284368Test.

العلاقة: isi:000621208900003; http://infoscience.epfl.ch/record/284368Test

الإتاحة: https://doi.org/10.23919/MIXDES49814.2020.9155997Test
http://infoscience.epfl.ch/record/284368Test

المؤلفون: Grabinski, Wladek, Abo-Elhadid, Ahmed, Mierzwinski, Marek, Lemaitre, Laurent, Brinson, Mike, Lallement, Christophe, Sallese, Jean-Michel, Yoshitomi, Sadayuki, Malisse, Paul, Oguey, Henri, Cserveny, Stefan, Pavanello, Marcelo, Enz, Christian, Krummenacher, Francois, Vittoz, Eric, Souza, Michelly de, Tomaszewski, Daniel, Malesinska, Jola, Gluszko, Grzegorz, Bucher, Matthias, Makris, Nikolaos, Nikolaou, Aristeidis

المصدر: ESSDERC 2019 - 49th European Solid-State Device Research Conference (ESSDERC)

الإتاحة: https://doi.org/10.1109/essderc.2019.8901822Test
http://xplorestaging.ieee.org/ielx7/8894830/8901681/08901822.pdf?arnumber=8901822Test

المؤلفون: Grabinski, Wladek, Pavanello, Marcelo, de Souza, Michelly, Tomaszewski, Daniel, Malesinska, Jola, Gluszko, Grzegorz, Bucher, Matthias, Makris, Nikolaos, Nikolaou, Aristeidis, Abo-Elhadid, Ahmed, Mierzwinski, Marek, Lemaitre, Laurent, Brinson, Mike, Lallement, Christophe, Sallese, Jean-Michel, Yoshitomi, Sadayuki, Malisse, Paul, Oguey, Henri, Cserveny, Stefan, Enz, Christian, Krummenacher, Francois, Vittoz, Eric

المصدر: http://infoscience.epfl.ch/record/276905Test.

العلاقة: isi:000520409500048; http://infoscience.epfl.ch/record/276905Test

الإتاحة: https://doi.org/10.1109/ESSDERC.2019.8901822Test
http://infoscience.epfl.ch/record/276905Test

المؤلفون: Ghouli, Salim El, Grabinski, Wladyslaw, Sallese, Jean Michel, Juge, Andre, Lallement, Christophe

المصدر: 2018 25th International Conference "Mixed Design of Integrated Circuits and System" (MIXDES)

الإتاحة: https://doi.org/10.23919/mixdes.2018.8436730Test
http://xplorestaging.ieee.org/ielx7/8422065/8436585/08436730.pdf?arnumber=8436730Test

المؤلفون: Madec, Morgan, Bonament, Alexi, Rosati, Elise, Hebrard, Luc, Lallement, Christophe

المصدر: 2018 16th IEEE International New Circuits and Systems Conference (NEWCAS)

الإتاحة: https://doi.org/10.1109/newcas.2018.8585653Test
http://xplorestaging.ieee.org/ielx7/8572699/8585422/08585653.pdf?arnumber=8585653Test