يعرض 1 - 10 نتائج من 17 نتيجة بحث عن '"Kim, Kyung Hwan"', وقت الاستعلام: 1.75s تنقيح النتائج
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    مؤتمر

    المصدر: 2017 IEEE International Symposium on Robotics and Intelligent Sensors (IRIS)

    الإتاحة: https://doi.org/10.1109/iris.2017.8250131Test
    http://xplorestagingTest.ieee.org/ielx7/8241060/8250084/08250131.pdf?arnumber=8250131

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    مؤتمر
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    المصدر: 2013 International Winter Workshop on Brain-Computer Interface (BCI)

    الإتاحة: https://doi.org/10.1109/iww-bci.2013.6506641Test
    http://xplorestagingTest.ieee.org/ielx7/6493537/6506604/06506641.pdf?arnumber=6506641

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    مؤتمر

    المصدر: 2012 17th Opto-Electronics and Communications Conference

    الإتاحة: https://doi.org/10.1109/oecc.2012.6276774Test
    http://xplorestagingTest.ieee.org/ielx5/6264151/6275948/06276774.pdf?arnumber=6276774

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    مؤتمر

    المصدر: 2011 International Topical Meeting on Microwave Photonics jointly held with the 2011 Asia-Pacific Microwave Photonics Conference

    الإتاحة: https://doi.org/10.1109/mwp.2011.6088746Test
    http://xplorestagingTest.ieee.org/ielx5/6083218/6088649/06088746.pdf?arnumber=6088746

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    مؤتمر

    المصدر: 2011 International Conference on Space Optical Systems and Applications (ICSOS)

    الإتاحة: https://doi.org/10.1109/icsos.2011.5783710Test
    http://xplorestagingTest.ieee.org/ielx5/5776394/5783648/05783710.pdf?arnumber=5783710

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    مؤتمر

    المصدر: 2011 Annual International Conference of the IEEE Engineering in Medicine and Biology Society

    الإتاحة: https://doi.org/10.1109/iembs.2011.6090255Test
    http://xplorestagingTest.ieee.org/ielx5/6067544/6089866/06090255.pdf?arnumber=6090255

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    مؤتمر

    المصدر: 2010 3rd International Nanoelectronics Conference (INEC)

    الإتاحة: https://doi.org/10.1109/inec.2010.5425024Test
    http://xplorestagingTest.ieee.org/ielx5/5416830/5424438/05425024.pdf?arnumber=5425024

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    مؤتمر

    المصدر: 2009 Fourth International Conference on Computer Sciences and Convergence Information Technology

    الإتاحة: https://doi.org/10.1109/iccit.2009.281Test
    http://xplorestagingTest.ieee.org/ielx5/5367867/5367868/05367947.pdf?arnumber=5367947