دورية أكاديمية

Preparation and Characterization of Single Crystal Diamond with High Purity and Low Dislocation Density.

التفاصيل البيبلوغرافية
العنوان: Preparation and Characterization of Single Crystal Diamond with High Purity and Low Dislocation Density. (English)
المؤلفون: HU Tingting, MU Lianxi, WANG Peng, TU Juping, LIU Jinlong, CHEN Liangxian, ZHANG Jianjun, OUYANG Xiaoping, LI Chengming
المصدر: Journal of Synthetic Crystals; Nov2023, Vol. 52 Issue 11, p1932-1938, 8p
مصطلحات موضوعية: SINGLE crystals, DIAMOND crystals, CRYSTAL growth, DISLOCATION density, CHEMICAL vapor deposition, MICROWAVE plasmas, EPITAXIAL layers
مستخلص: With its excellent properties such as high thermal conductivity, strong radiation resistance and high electron mobility, diamond has become one of the most suitable materials for radiation detectors. Detector-grade diamond requires low impurity content, low dislocation density and other defects. However, it is very difficult to keep low impurities and low dislocations simultaneously in the actual crystal growth process. In this study, microwave plasma chemical vapor deposition (MPCVD) method was used to grow diamond layer on two high-quality HPHT diamond substrates with the previously optimized process conditions. The nitrogen impurity content and structure of the HPHT substrate and growth layer were characterized and analyzed. The results show that, the content of nitrogen impurity on two HPHT substrates are 7. 1 x 10-6% and 4. 04 x 10-8%, respectively, whereas in their epitaxial diamond layers, the nitrogen impurity content are 2. 1 x 10-7% and 5 x 10-8%, respectively. The full width at half-maximum of the rocking curve shows that the dislocation density of the MPCVD growth layer is comparable to the HPHT substrate, though some dislocations were introduced into the MPCVD growth layer, which increases the stress. Overall, the dislocations in the HPHT substrate and epitaxial layer of single crystal diamond are in the same order of magnitude. The high-purity single crystal diamond prepared in this work may be used in nuclear radiation detection and semiconductor fields. [ABSTRACT FROM AUTHOR]
Copyright of Journal of Synthetic Crystals is the property of Journal of Synthetic Crystals Editorial Office and its content may not be copied or emailed to multiple sites or posted to a listserv without the copyright holder's express written permission. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.)
قاعدة البيانات: Complementary Index