التفاصيل البيبلوغرافية
| العنوان: |
Collection of propagating electromagnetic fields by uncoated probe. |
| المؤلفون: |
Shafiei, Farbod1 (AUTHOR) farbod@physics.utexas.edu, Downer, Michael C.1 (AUTHOR) |
| المصدر: |
Ultramicroscopy. Oct2022, Vol. 240, pN.PAG-N.PAG. 1p. |
| مصطلحات موضوعية: |
*ELECTROMAGNETIC fields, *OPTICAL resolution, *METAL coating, *OPTICAL limiting, *OPTICAL coatings, *SCINTILLATORS, *LIGHT sources |
| مستخلص: |
• Light collection by an un-coated fiber probe is simulated for the first time, analyzing sample illumination through the probe. • Simulation of shape of the tapered part of the probe shows minimized leakage through uncoated probe side by optimal shape. • Experiment and simulations show that light is collected mostly through the uncoated fiber probe's 50 nm aperture. • Experiments and simulations show that 50 nm aperture probe enables ~20 nm optical resolution. Understanding light-matter interaction at the nanoscale by observation of fine details of electromagnetic fields is achieved by bringing nanoscale probes into the nearfield of light sources, capturing information that is lost in the far field. Although metal coated probes are often used for nearfield microscopy, they strongly perturb the electromagnetic fields under study. Here, through experiment and simulation, we detail light collection by uncoated fiber probes, which minimize such perturbation. Second-harmonic light from intensely-irradiated sub-wavelength sub-surface features was imaged to avoid otherwise dominating fundamental light background, yielding clear nearfield details through a 50 nm aperture uncoated probe with ∼23 nm optical resolution. Simulations show how a metallic coating distorts optical nearfields and limits optical coupling into the probe in comparison to an uncoated probe. [ABSTRACT FROM AUTHOR] |
| قاعدة البيانات: |
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