المؤلفون: Souchier, E.¹, Besland, M.-P.¹ marie-paule.besland@cnrs-imn.fr, Tranchant, J.¹, Corraze, B.¹, Moreau, P.¹, Retoux, R.², Estournès, C.³, Mazoyer, P.⁴, Cario, L.¹, Janod, E.¹

المصدر: Thin Solid Films. Apr2013, Vol. 533, p54-60. 7p.

مصطلحات موضوعية: *MAGNETRON sputtering, *RADIO frequency, *GALLIUM alloys, *THIN films, *NONVOLATILE random-access memory, *ARGON, *SINTERING

المؤلفون: Callard, S., Gagnaire, A., Besland, M. P., Joseph, J.

المصدر: Thin Solid Films; 1998, Vol. 313 Issue: 1 p479-483, 5p

المؤلفون: Rupp, J.A.J.¹ (AUTHOR) JonathanRupp@gmx.net, Janod, E.² (AUTHOR), Besland, M.-P.² (AUTHOR), Corraze, B.^1,2,3 (AUTHOR), Kindsmüller, A.¹ (AUTHOR), Querré, M.² (AUTHOR), Tranchant, J.² (AUTHOR), Cario, L.² (AUTHOR), Dittmann, R.³ (AUTHOR), Waser, R.^1,3 (AUTHOR), Wouters, D.J.¹ (AUTHOR)

المصدر: Thin Solid Films. Jul2020, Vol. 705, pN.PAG-N.PAG. 1p.

مصطلحات موضوعية: *REACTIVE sputtering, *PLATINUM electrodes, *X-ray photoelectron spectroscopy, *ATOMIC force microscopy, *THIN films, *OXIDE coating

المؤلفون: Han, Jun-feng^1,2 junfeng.han@cnrs-imn.fr, Liao, Cheng^2,3, Jiang, Tao², Xie, Hua-mu², Zhao, Kui², Besland, M.–P.¹

المصدر: Thin Solid Films. Oct2013, Vol. 545, p251-256. 6p.

مصطلحات موضوعية: *CHALCOPYRITE, *METALLIC thin films, *MAGNETRON sputtering, *MULTILAYERS, *LOW temperatures, *X-ray diffraction, *SCANNING electron microscopy

المؤلفون: Tranchant, J.¹ julien.tranchant@cnrs-imn.fr, Janod, E.¹, Cario, L.¹, Corraze, B.¹, Souchier, E.¹, Leclercq, J.-L.², Cremillieu, P.², Moreau, P.¹, Besland, M.-P.¹

المصدر: Thin Solid Films. Apr2013, Vol. 533, p61-65. 5p.

مصطلحات موضوعية: *NONVOLATILE random-access memory, *GALLIUM alloys, *THIN films, *ELECTRIC properties, *MOTT effect (Physics), *SWITCHING theory, *TRANSMISSION electron microscopy