On the origin of surface and interface defects associated with the growth of Al‐coated thermoplastic heterostacks
| العنوان: | On the origin of surface and interface defects associated with the growth of Al‐coated thermoplastic heterostacks |
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| المؤلفون: | Simone Dal Zilio, Diego Dreossi, Erik Vesselli, Luigi Rigon, Francesca Di Lillo, M. Del Linz, Luca Brombal, Sandro Donato, Renata Longo, Regina Ciancio, Tommaso Fontanot, Sara Paroni |
| المساهمون: | Fontanot, T., Donato, S., Brombal, L., Di Lillo, F., Dreossi, D., Rigon, L., Longo, R., Dal Zilio, S., Ciancio, R., Del Linz, M., Paroni, S., Vesselli, E. |
| المصدر: | Surface and Interface Analysis. 53:350-358 |
| بيانات النشر: | Wiley, 2020. |
| سنة النشر: | 2020 |
| مصطلحات موضوعية: | Surface (mathematics), chemistry.chemical_classification, Materials science, Thermoplastic, metal, Interface (Java), polymer, Surfaces and Interfaces, General Chemistry, Polymer, Condensed Matter Physics, EDS, Surfaces, Coatings and Films, Metal, chemistry, visual_art, SEM, synchrotron radiation X-ray computed tomography, Materials Chemistry, visual_art.visual_art_medium, heterostack, heterostacks, Composite material |
| الوصف: | By means of a combined microscopy-, spectroscopy-, and tomography-based approach, we investigated surface and interface defects in metal-polymer heterostacks. The aim was to characterize both morphological and compositional alterations of the surfaces, originating in the physical vapor deposition (PVD) growth methods adopted in the fabrication process. Synchrotron radiation X-ray computed tomography (CT) and scanning electron microscopy (SEM) coupled with energy dispersive X-ray Spectroscopy (EDS) indicate that both chemical contaminations, introduced in the fabrication process, and growth conditions strongly affect the presence of defects. On the basis of our results, we classified the defects into four main families. Interestingly, the faults are mainly located at the metal-polymer interface. Thanks to this study, we have been able to gain a deeper insight into the defects' origins and nature, allowing the identification of the precise production steps involved in the generation of the selected defects. |
| وصف الملف: | ELETTRONICO |
| تدمد: | 1096-9918 0142-2421 |
| الوصول الحر: | https://explore.openaire.eu/search/publication?articleId=doi_dedup___::30f5f5675a8d5246e8d103e707567b94Test https://doi.org/10.1002/sia.6923Test |
| حقوق: | CLOSED |
| رقم الانضمام: | edsair.doi.dedup.....30f5f5675a8d5246e8d103e707567b94 |
| قاعدة البيانات: | OpenAIRE |
| تدمد: | 10969918 01422421 |
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