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المؤلفون: Marco Freire, Thierry Viard, Stefan Kraft, Wilfried Noell, Arnaud Liotard, Frederic Zamkotsian, Benedikt Guldimann
المصدر: SPIE Proceedings.
مصطلحات موضوعية: Microelectromechanical systems, Optics, Cardinal point, Signal-to-noise ratio, Band-pass filter, Spectrometer, business.industry, Computer science, Filter (video), Detector, business, Diffraction grating
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::57eadb8ffe8f1e579bdc2f37de4eeb3dTest
https://doi.org/10.1117/12.926142Test -
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المؤلفون: Stefan Kraft, Benedikt Guldimann
المصدر: SPIE Proceedings.
مصطلحات موضوعية: Physics, Spectrometer, Physics::Instrumentation and Detectors, business.industry, Optical instrument, Astrophysics::Instrumentation and Methods for Astrophysics, Imaging spectrometer, law.invention, Cardinal point, Optics, law, Miniaturization, Spectral resolution, business, Waveguide, Diffraction grating
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::5fa10c9dd7d1e4efdea0127b46754148Test
https://doi.org/10.1117/12.882501Test -
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المؤلفون: Marcos Bavdaz, Coen van Baren, M. Collon, Michael Krumrey, Rakesh Partapsing, Ramses Günther, Marco W. Beijersbergen, Kotska Wallace, Peter Müller, Dirk Kampf, Stefan Kraft
المصدر: SPIE Proceedings.
مصطلحات موضوعية: Physics, business.industry, X-ray optics, X-ray telescope, Finite element method, Metrology, law.invention, Telescope, Optics, Stack (abstract data type), law, Function model, Focal length, business
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::0a04227238a232da6a4551bf9a896efcTest
https://doi.org/10.1117/12.673269Test -
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المؤلفون: Stefan Kraft, Michael Freyberg, Kotska Wallace, Roland Graue, Dirk Kampf, Maximilien J. Collon, Marcos Bavdaz, David H. Lumb, Marco W. Beijersbergen
المصدر: SPIE Proceedings.
مصطلحات موضوعية: Structure (mathematical logic), Physics, Silicon, business.industry, Emphasis (telecommunications), Detector, chemistry.chemical_element, Context (language use), law.invention, Telescope, Optics, chemistry, Material selection, law, Function model, business
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::7e0d82e2a6f0b8870fb6e2ebf5ff61cbTest
https://doi.org/10.1117/12.671375Test -
5
المؤلفون: Marco W. Beijersbergen, Marcos Bavdaz, Anthony J. Peacock, Kotska Wallace, David H. Lumb, Maximilien J. Collon, Ramses Günther, Stefan Kraft
المصدر: SPIE Proceedings.
مصطلحات موضوعية: Materials science, Silicon, business.industry, Optical engineering, X-ray optics, chemistry.chemical_element, Modular design, Metrology, Optics, Semiconductor, chemistry, Wafer, Angular resolution, business
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::41e8255d909062597b00a81beb2c2542Test
https://doi.org/10.1117/12.673248Test -
6
المؤلفون: Sumant Oemrawsingh, Marcos Bavdaz, Aleksander Lyngvi, Thijs van der Laan, Roland Graue, Michael Freyberg, Marco W. Beijersbergen, Stefan Kraft, Kotska Wallace, Arjan L. Mieremet, Nicola Rando, Philippe Gondoin, Dirk Kampf, David H. Lumb, Tone Peacock, Maximilien J. Collon
المصدر: SPIE Proceedings.
مصطلحات موضوعية: Physics, X-ray astronomy, business.industry, X-ray optics, X-ray telescope, Orbital mechanics, law.invention, Telescope, Optics, law, Angular resolution, Ray tracing (graphics), business, Aerospace
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::bc3b4666576339e0726a7a48136230ccTest
https://doi.org/10.1117/12.670240Test -
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المؤلفون: Anthony J. Peacock, M. Collon, Stefan Kraft, David H. Lumb, Volker Lehmann, Michael Krumrey, Kotska Wallace, Marcos Bavdaz, Marco W. Beijersbergen
المصدر: SPIE Proceedings.
مصطلحات موضوعية: Physics, business.industry, Scale (chemistry), Antenna aperture, X-ray optics, X-ray telescope, Modular design, law.invention, Metrology, Telescope, Optics, law, business, Envelope (motion)
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::10a53832737909f58e1d3321b6e3da73Test
https://doi.org/10.1117/12.673267Test -
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المؤلفون: Marcos Bavdaz, E. Maddox, L. Cibik, Michael Freyberg, Marco W. Beijersbergen, David H. Lumb, Michael Krumrey, Kotska Wallace, Maximilien J. Collon, Ramses Günther, Stefan Kraft
المصدر: SPIE Proceedings.
مصطلحات موضوعية: Materials science, Silicon, business.industry, X-ray optics, chemistry.chemical_element, X-ray telescope, Characterization (materials science), Optics, Stack (abstract data type), chemistry, Wafer, business, Image resolution, Beam (structure)
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::bec50aa4e29b993f95bef3d4ccfbf89bTest
https://doi.org/10.1117/12.673268Test -
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المؤلفون: Michael Freyberg, Marcos Bavdaz, Günther Hasinger, Stefan Kraft, Wolfgang Burkert, Maximilien J. Collon, Kotska Wallace, Marco W. Beijersbergen, Bernd Budau, David H. Lumb, Dirk Kampf, Gisela Hartner
المصدر: SPIE Proceedings.
مصطلحات موضوعية: Physics, Spectrometer, business.industry, Astrophysics::High Energy Astrophysical Phenomena, Instrumentation, Vacuum tube, Astrophysics::Instrumentation and Methods for Astrophysics, law.invention, Cardinal point, Optics, law, ROSAT, Calibration, Focal length, Spectral resolution, business
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::052ff26bd748338065a2189ef739fe19Test
https://doi.org/10.1117/12.673300Test -
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المؤلفون: Marcos Bavdaz, David Lumb, K. M. Wallace, Anthony Peacock, Marco Beijersbergen, Stefan Kraft
المصدر: SPIE Proceedings.
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::6b14fa304d3e83c1173a8f852deab1cbTest
https://doi.org/10.1117/12.616700Test