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المؤلفون: Louis, Eric, Khorsand, A.R., Sobierajski, R., van Hattum, E.D., Jurek, M., Klinger, D., Pelka, J.B., Juha, L., Chalupsky, J., Cihelka, J., Hajkova, V., Jastrow, U., Toleikis, S., Wabnitz, H., Tiedtke, K., Gaudin, J., Gullikson, E.M., Bijkerk, Frederik, Juha, Libor, Bajt, Saša, Sobierajski, Ryszard
المساهمون: Laser Physics & Nonlinear Optics
المصدر: Damage to VUV, EUV, and X-Ray Optics II: 21–23 April 2009, Prague, Czech Republic
Damage to VUV, EUV, and X-Ray Optics IIمصطلحات موضوعية: Free electron model, business.industry, Chemistry, Free-electron laser, Laser, law.invention, Optics, Optical microscope, law, METIS-266557, Extreme ultraviolet, Femtosecond, Radiation damage, High-resolution transmission electron microscopy, business
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::f587e9f566034645bde7e931b89d6298Test
https://doi.org/10.1117/12.822257Test -
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المؤلفون: Cihelka, J, Juha, L, Chalupský, J, Rosmej, FB, Renner, O, Saksl, K, Hájková, V, Vyšín, L, Galtier, E, Schott, R, Khorsand, AR, Riley, D, Dzelzainis, T, Nelson, AJ, Lee, RW, Heimann, PA, Nagler, B, Vinko, S, Wark, J, Whitcher, T, Toleikis, S, Tschentscher, T, Fäustlin, R, Wabnitz, H, Bajt, S, Chapman, H, Krzywinski, J, Sobierajski, R, Klinger, D, Jurek, M, Pelka, J, Hau-Riege, S, London, RA, Kuba, J, Stojanovic, N, Sokolowski-Tinten, K, Gleeson, AJ, Störmer, M, Andreasson, J, Hajdu, J, Iwan, B, Timneanu, N
المصدر: SPIE Proceedings.
مصطلحات موضوعية: Materials science, Spectrometer, law, Analytical chemistry, Irradiation, Excitation temperature, Emission spectrum, Laser, Luminescence, Spectral line, Ion, law.invention
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::fb7711d8f0247daa5745e6429d790071Test
https://doi.org/10.1117/12.822766Test