التفاصيل البيبلوغرافية
| العنوان: |
Characterization of CuInS2-Cu2ZnSnS4 crystals grown from the melt. |
| المؤلفون: |
Oishi, Koichiro, Nakamura, Kenta, Yamazaki, Makoto, Fukai, Shota, Shigeno, Takuya, Katagiri, Hironori |
| المصدر: |
Physica Status Solidi (C); Jun2015, Vol. 12 Issue 6, p696-699, 4p |
| مصطلحات موضوعية: |
CRYSTAL growth, CHEMICAL synthesis, X-ray powder diffraction, X-ray crystallography technique, LATTICE constants, RIETVELD refinement |
| مستخلص: |
Cu2(2.00- x)((2In) y (ZnSn)(1.00- y)) x S4 crystals were grown from the melt. 23 samples with different x and y values were synthesized by heating constituent elementary Cu, In, S and Zn-Sn alloy at 1,250 °C for 10 hours in each evacuated fused-quartz ampule. All samples were characterized by powder X-ray diffraction analysis. Two peaks are seen at the 112 diffraction positions in 0.3 ≤ y ≤ 0.9. The FWHM of the 112 diffraction peak broadened in 0.2 ≤ y ≤ 0.7. Lattice constants were obtained by Rietveld method using two tetragonal structure models simultaneously in the refinement. Both a and c obtained as CuInS2 phase changed almost linearly in y ≥ 0.7; therefore the existence of CuInS2 phase solid solution containing Zn and Sn was indicated in this region. The miscibility gap was also suggested as the region of 0.2 ≤ y ≤ 0.7 in our results because of the shape and the broadening of the 112 diffraction peaks. (© 2015 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim) [ABSTRACT FROM AUTHOR] |
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| قاعدة البيانات: |
Complementary Index |
