دورية أكاديمية

High-performance direct conversion X-ray detectors based on sintered hybrid lead triiodide perovskite wafers.

التفاصيل البيبلوغرافية
العنوان: High-performance direct conversion X-ray detectors based on sintered hybrid lead triiodide perovskite wafers.
المؤلفون: Shrestha, Shreetu, Fischer, René, Matt, Gebhard J., Feldner, Patrick, Michel, Thilo, Osvet, Andres, Levchuk, Ievgen, Merle, Benoit, Golkar, Saeedeh, Chen, Haiwei, Tedde, Sandro F., Schmidt, Oliver, Hock, Rainer, Rührig, Manfred, Göken, Mathias, Heiss, Wolfgang, Anton, Gisela, Brabec, Christoph J.
المصدر: Nature Photonics; Jul2017, Vol. 11 Issue 7, p436-440, 5p, 1 Black and White Photograph, 3 Graphs
مستخلص: Lead halide perovskite semiconductors are in general known to have an inherently high X-ray absorption cross-section and a significantly higher carrier mobility than any other low-temperature solution-processed semiconductor. So far, the processing of several-hundred-micrometres-thick high-quality crystalline perovskite films over a large area has been unresolved for efficient X-ray detection. In this Article, we present a mechanical sintering process to fabricate polycrystalline methyl ammonium lead triiodide perovskite (MAPbI3) wafers with millimetre thickness and well-defined crystallinity. Benchmarking of the MAPbI3 wafers against state-of-the-art CdTe detectors reveals competitive conversion efficiencies of 2,527 µC Gyair−1 cm−2 under 70 kVp X-ray exposure. The high ambipolar mobility-lifetime product of 2 × 10−4 cm2 V−1 is suggested to be responsible for this exceptionally high sensitivity. Our findings inform a new generation of highly efficient and low-cost X-ray detectors based on perovskite wafers. [ABSTRACT FROM AUTHOR]
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قاعدة البيانات: Complementary Index
الوصف
تدمد:17494885
DOI:10.1038/nphoton.2017.94