التفاصيل البيبلوغرافية
| العنوان: |
Local Voltage Drop in a Single Functionalized Graphene Sheet Characterized by Kelvin Probe Force Microscopy. |
| المؤلفون: |
Liang Yan1, Christian Punckt1, Ilhan A. Aksay1, Wolfgang Mertin1, Gerd Bacher1 |
| المصدر: |
Nano Letters. Sep2011, Vol. 11 Issue 9, p3543-3549. 7p. |
| مصطلحات موضوعية: |
*FUNCTIONAL groups, *GRAPHENE, *SCANNING probe microscopy, *ELECTRIC currents, *ELECTRIC conductivity, *ELECTRIC contacts, *ELECTRIC resistance |
| مستخلص: |
We studied the local voltage drop in functionalized graphene sheets of subμm size under external bias conditions by Kelvin probe force microscopy. Using this noninvasive experimental approach, we measured ohmic currentâvoltage characteristics and an intrinsic conductivity of about 3.7 à 105S/m corresponding to a sheet resistance of 2.7 kΩ/sq under ambient conditions for graphene produced via thermal reduction of graphite oxide. The contact resistivity between functionalized graphene and metal electrode was found to be <6.3 à 10â7Ωcm2. [ABSTRACT FROM AUTHOR] |
| قاعدة البيانات: |
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