مؤتمر
Verification of impedance matching at the surface of left-handed materials
| العنوان: | Verification of impedance matching at the surface of left-handed materials |
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| المؤلفون: | Aydin, K., Bulu I., Ozbay, E. |
| المصدر: | Microwave and Optical Technology Letters |
| سنة النشر: | 2006 |
| المجموعة: | Bilkent University: Institutional Repository |
| مصطلحات موضوعية: | Impedance matching, Left-handed materials, Metamaterials, Perfect lens, Reflection, Computer simulation, Electromagnetic wave reflection, Finite difference method, Lenses, Natural frequencies, Time domain analysis, Wave propagation, FDTD simulations, Left handed materials (LHM), Impedance matching (electric) |
| الوصف: | Impedance matching at the surface of left-handed materials (LHM) is required for certain applications including a perfect lens. In this study, we present the experimental and theoretical verification of an impedance-matched LHM to free space. Reflection characteristics of both one-dimensional and two-dimensional LHM were investigated. The reflection was observed to be very low at a narrow frequency range. FDTD simulations and retrieval procedures were used to theoretically verify impedance matching. By varying the number of layers along the propagation direction, the ultralow reflection at specific frequencies was shown to be independent of the sample thickness. © 2006 Wiley Periodicals, Inc. |
| نوع الوثيقة: | conference object |
| وصف الملف: | application/pdf |
| اللغة: | English |
| العلاقة: | http://dx.doi.org/10.1002/mop.22003Test; 8952477; http://hdl.handle.net/11693/27204Test |
| DOI: | 10.1002/mop.22003 |
| الإتاحة: | https://doi.org/10.1002/mop.22003Test http://hdl.handle.net/11693/27204Test |
| رقم الانضمام: | edsbas.10988E8F |
| قاعدة البيانات: | BASE |
| DOI: | 10.1002/mop.22003 |
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