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1
المؤلفون: Tianhang Yao, Tianye Huang, Bin Yan, Mingfeng Ge, Jie Yin, Chuyu Peng, Lu Li, Wufeng Sun, Perry Ping Shum
المصدر: Journal of the Optical Society of America B. 40:1525
مصطلحات موضوعية: Statistical and Nonlinear Physics, Atomic and Molecular Physics, and Optics
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::36eafc6d26567bcbb594c8a023060623Test
https://doi.org/10.1364/josab.491490Test -
2
المؤلفون: Tianhang Yao, Tianye Huang, Xuming Zeng, Zhichao Wu, Jing Zhang, Dapeng Luo, Xiangli Zhang, Yong Wang, Zhuo Cheng, Xiang Li, Lei Han, Perry Ping Shum
المصدر: Journal of the Optical Society of America B. 39:2564
مصطلحات موضوعية: Statistical and Nonlinear Physics, Atomic and Molecular Physics, and Optics
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::9b661254a527e15e3746f7bdc9553a56Test
https://doi.org/10.1364/josab.456893Test -
3
المؤلفون: Tianye Huang, Perry Ping Shum, Rongrong Lei, Li-Yang Shao, Gangshun Zhang, Yiheng Wu, Xin Tu, Guizhen Xu, Jianxing Pan
المصدر: Journal of the Optical Society of America B. 38:2680
مصطلحات موضوعية: Materials science, business.industry, Statistical and Nonlinear Physics, Grating, Interference (wave propagation), Atomic and Molecular Physics, and Optics, law.invention, Optics, Fiber optic sensor, law, Dispersion (optics), Group velocity, Sensitivity (control systems), business, Refractive index, Waveguide
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::9bc7e74a4bc30a45dab7fda02d99631cTest
https://doi.org/10.1364/josab.430736Test -
4
المؤلفون: Ming Yang, Guizhen Xu, Qizheng Ji, Jin Wang, Jianxing Pan, Perry Ping Shum, Yuan Xie, Tianye Huang
المصدر: Journal of the Optical Society of America B. 37:257
مصطلحات موضوعية: Detection limit, Materials science, Field (physics), business.industry, Statistical and Nonlinear Physics, Grating, Slow light, 01 natural sciences, Atomic and Molecular Physics, and Optics, 010309 optics, 0103 physical sciences, Group index, Optoelectronics, Effective refractive index, business, Electron-beam lithography
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::7cc723bc96f9815ac0d09a28c9cee822Test
https://doi.org/10.1364/josab.380251Test