Raman scattering studies of Cu2ZnSnS4 thin films: Local distribution of the secondary phase Cu2−x S and the effect of KCN etching on Cu2−x S
| العنوان: | Raman scattering studies of Cu2ZnSnS4 thin films: Local distribution of the secondary phase Cu2−x S and the effect of KCN etching on Cu2−x S |
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| المؤلفون: | Jin Young Kim, Hae Young Shin, Trang Thi Thu Nguyen, William Jo, Gee Yeong Kim, Seokhyun Yoon, Ki Doo Lee, Ju Ri Kim |
| المصدر: | Journal of the Korean Physical Society. 66:117-122 |
| بيانات النشر: | Korean Physical Society, 2015. |
| سنة النشر: | 2015 |
| مصطلحات موضوعية: | Phonon, business.industry, Scattering, Analytical chemistry, General Physics and Astronomy, symbols.namesake, chemistry.chemical_compound, Optics, chemistry, Etching (microfabrication), symbols, CZTS, Thin film, business, Spectroscopy, Raman spectroscopy, Raman scattering |
| الوصف: | We used X-ray diffraction (XRD) and Raman scattering spectroscopy to study Cu2ZnSnS4 (CZTS) thin films grown by using an electroplating method. We compared the Raman spectra of the CZTS thin films before and after potassium cyanide (KCN) etching. We observed a phonon mode of the secondary phase Cu2−x S both from Cu-rich and Cu-poor CZTS samples before the KCN etching. We found that the intensity of the Cu2−x S-related vibration mode depended on the excitation wavelength, from which we could estimate the stoichiometry of the Cu2−x S as x = 1. Interestingly, the Cu2−x S phonon is completely removed after the KCN etching. We could also get information regarding the local distribution of the secondary phase on the surfaces of the CZTS thin films by using micro-Raman scattering spectroscopy. |
| تدمد: | 1976-8524 0374-4884 |
| الوصول الحر: | https://explore.openaire.eu/search/publication?articleId=doi_________::fa88122a3adf641aca02635431748437Test https://doi.org/10.3938/jkps.66.117Test |
| حقوق: | CLOSED |
| رقم الانضمام: | edsair.doi...........fa88122a3adf641aca02635431748437 |
| قاعدة البيانات: | OpenAIRE |
| تدمد: | 19768524 03744884 |
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