المؤلفون: Shiel, Huw, Hobson, Theodore D. C., Hutter, Oliver S., Phillips, Laurie J., Smiles, Matthew J., Jones, Leanne A. H., Featherstone, Thomas J., Swallow, Jack E. N., Thakur, Pardeep K., Lee, Tien-Lin, Major, Jonathan D., Durose, Ken, Veal, Tim D.

المصدر: Journal of Applied Physics; 6/21/2021, Vol. 129 Issue 23, p1-7, 7p

مصطلحات موضوعية: THIN film deposition, THIN films, VALENCE bands, SELENIDES, PHOTOEMISSION

المؤلفون: Hudson, Stephen D., Zhurov, Vladimir, Grbic, Vojislava, Grbic, Miodrag, Hutter, Jeffrey L.

المصدر: Journal of Applied Physics; Apr2013, Vol. 113 Issue 15, p154307, 7p, 1 Color Photograph, 1 Diagram, 2 Charts, 4 Graphs

مصطلحات موضوعية: SPIDER mites, SILK, ANIMAL fibers, ATOMIC force microscopy, BIOMATERIALS

المؤلفون: Frömling, T., Hou, J., Preis, W., Sitte, W., Hutter, H., Fleig, J.

المصدر: Journal of Applied Physics; Aug2011, Vol. 110 Issue 4, p043531, 7p

مصطلحات موضوعية: OXIDATION, BARIUM, TEMPERATURE coefficient of electric resistance, TITANIUM, FERROELECTRICITY

المؤلفون: Guhados, Ganesh, Wan, Wankei, Sun, Xueliang, Hutter, Jeffrey L.

المصدر: Journal of Applied Physics; 2/1/2007, Vol. 101 Issue 3, p033514-N.PAG, 5p, 1 Color Photograph, 2 Black and White Photographs, 1 Diagram, 2 Graphs

مصطلحات موضوعية: MEASUREMENT, ELASTICITY, SHEAR (Mechanics), CARBON nanotubes, ATOMIC force microscopy

المؤلفون: Kögler, R., Peeva, A., Lebedev, A., Posselt, M., Skorupa, W., Özelt, G., Hutter, H., Behar, M.

المصدر: Journal of Applied Physics; 9/15/2003, Vol. 94 Issue 6, p3834, 6p, 2 Charts, 4 Graphs

مصطلحات موضوعية: COPPER, SILICON crystals, SECONDARY ion mass spectrometry

المؤلفون: Hutter, E., Fendler, J. H., Roy, D.

المصدر: Journal of Applied Physics. 8/15/2001, Vol. 90 Issue 4, p1977. 9p. 2 Black and White Photographs, 1 Diagram, 1 Chart, 2 Graphs.

مصطلحات موضوعية: *PLASMONS (Physics), *NANOSTRUCTURED materials, *SCANNING electron microscopy

المؤلفون: Hutter, Jeffrey L., Bechhoefer, John

المصدر: Journal of Applied Physics. 5/1/1993, Vol. 73 Issue 9, p4123. 7p. 1 Diagram, 1 Graph.

مصطلحات موضوعية: *VAN der Waals forces, *ATOMIC force microscopy

المؤلفون: Hutter, R. G. E., Harrison, S. W.

المصدر: Journal of Applied Physics; Feb1950, Vol. 21 Issue 2, p84-89, 6p

المؤلفون: Hutter, R. G. E.

المصدر: Journal of Applied Physics; Sep1947, Vol. 18 Issue 9, p797-810, 14p

المؤلفون: Hutter, R. G. E.

المصدر: Journal of Applied Physics; Aug1947, Vol. 18 Issue 8, p740-758, 19p