المؤلفون: Lopez-Cazalilla, A., Chowdhury, D., Ilinov, A., Mondal, S., Barman, P., Bhattacharyya, S. R., Ghose, D., Djurabekova, F., Nordlund, K., Norris, S.

المصدر: Journal of Applied Physics; 2018, Vol. 123 Issue 23, pN.PAG-N.PAG, 10p, 4 Diagrams, 1 Chart, 6 Graphs

مصطلحات موضوعية: IRRADIATION, WAVELENGTHS, SILICON, TEMPERATURE, MOLECULAR dynamics

المؤلفون: Ghose, Susmita¹, Rahman, Shafiqur¹, Liang Hong², Rojas-Ramirez, Juan Salvador³, Hanbyul Jin⁴, Kibog Park^4,5, Klie, Robert², Droopad, Ravi³

المصدر: Journal of Applied Physics. 2017, Vol. 122 Issue 9, p1-8. 8p. 2 Color Photographs, 1 Chart, 7 Graphs.

مصطلحات موضوعية: *EPITAXY, *GALLIUM, *OXIDES, *MOLECULAR beam epitaxy, *THIN films, *PHOTOELECTRON spectroscopy

المؤلفون: Minato, Shohei¹ s.minato-1@tudelft.nl, Ghose, Ranajit¹ r.ghose@tudelft.nl

المصدر: Journal of Applied Physics. 2017, Vol. 121 Issue 10, p1-14. 14p. 1 Diagram, 3 Graphs.

مصطلحات موضوعية: *BOREHOLES, *SCATTERING (Physics), *HYDRAULIC fracturing, *VISCOSITY, *FLUID flow

المؤلفون: Kibog Park, Ravi Droopad, Shafiqur Rahman, Robert F. Klie, J.S. Rojas-Ramirez, Susmita Ghose, Hanbyul Jin, Liang Hong

المصدر: Journal of Applied Physics. 124:139901

مصطلحات موضوعية: 010302 applied physics, Materials science, business.industry, General Physics and Astronomy, Photodetector, 02 engineering and technology, 021001 nanoscience & nanotechnology, 01 natural sciences, Characterization (materials science), 0103 physical sciences, Optoelectronics, Thin film, 0210 nano-technology, business, Molecular beam epitaxy

الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::980ee157d89cd8180a311e76c7a84a72Test
https://doi.org/10.1063/1.5051998Test

المؤلفون: Mollick, S. A.¹, Ghose, D.¹

المصدر: Journal of Applied Physics. Aug2009, Vol. 106 Issue 4, p044309-1-044309-6. 6p. 3 Color Photographs, 3 Graphs.

مصطلحات موضوعية: *ION bombardment, *SPUTTERING (Physics), *SURFACE roughness, *TOPOLOGICAL defects (Physics), *SEMICONDUCTOR wafers, *SILICON

المؤلفون: Mishra, P.¹, Ghose, D.¹

المصدر: Journal of Applied Physics. Jan2009, Vol. 105 Issue 1, p014304. 6p. 3 Diagrams, 4 Graphs.

مصطلحات موضوعية: *SURFACE roughness, *OXYGEN, *SPUTTERING (Physics), *ALUMINUM, *METALLIC films, *ION bombardment, *SILICON

المؤلفون: Mishra, P.¹, Ghose, D.¹

المصدر: Journal of Applied Physics. Nov2008, Vol. 104 Issue 9, p094305. 5p. 1 Diagram, 1 Chart, 1 Graph.

مصطلحات موضوعية: *IONS, *THIN films, *METALLIC films, *ALUMINUM films, *ION bombardment

المؤلفون: Zhong, Y., Bailat, C., Averback, R. S., Ghose, S. K., Robinson, I. K.

المصدر: Journal of Applied Physics; 8/1/2004, Vol. 96 Issue 3, p1328-1335, 8p, 1 Chart, 8 Graphs

مصطلحات موضوعية: SILICON, ION implantation, ION bombardment, IONS, NUCLEAR physics

المؤلفون: Dey, S., Roy, A., Ghose, J., Bhowmik, R. N., Ranganathan, R.

المصدر: Journal of Applied Physics; 10/15/2001, Vol. 90 Issue 8, p4138, 5p, 1 Black and White Photograph, 2 Charts, 4 Graphs

مصطلحات موضوعية: COBALT compounds, FERRITES, DILUTION, MAGNETIC properties

المؤلفون: Liang Hong, Ravi Droopad, J.S. Rojas-Ramirez, Kibog Park, Shafiqur Rahman, Robert F. Klie, Susmita Ghose, Hanbyul Jin

المصدر: Journal of Applied Physics. 122:095302

مصطلحات موضوعية: 010302 applied physics, Materials science, business.industry, Analytical chemistry, General Physics and Astronomy, 02 engineering and technology, Substrate (electronics), 021001 nanoscience & nanotechnology, Epitaxy, 01 natural sciences, Stranski–Krastanov growth, X-ray photoelectron spectroscopy, 0103 physical sciences, Scanning transmission electron microscopy, Sapphire, Optoelectronics, Thin film, 0210 nano-technology, business, Molecular beam epitaxy

الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::b3276ba462dd77a4de8d93d18aa054cfTest
https://doi.org/10.1063/1.4985855Test