دورية أكاديمية

Low-Stress Permalloy for Magnetic MEMS Switches.

التفاصيل البيبلوغرافية
العنوان: Low-Stress Permalloy for Magnetic MEMS Switches.
المؤلفون: Yonghua Zhang1 zyh@sjtu.edu.cn, Guifu Ding1, Hong Wang1, Shi Fu1, Bingchu Cai1
المصدر: IEEE Transactions on Magnetics. Jan2006, Vol. 42 Issue 1, p51-55. 5p.
مصطلحات موضوعية: RESIDUAL stresses, MAGNETIC films, MAGNETIC materials, MICROELECTROMECHANICAL systems, ELECTROPLATING, METAL coating
مستخلص: The residual stress in the electroplated magnetic films is an important factor that limits the functionality of many micromagnetic devices. We have investigated the stress in electroplated Ni-Fe alloy for MEMS as a function of bath concentration, utilizing the wafer-bending method. Our investigation demonstrated that a low-concentration plating solution decreases the residual stress in the electrode-posits, and the stress is further decreased by increasing the saccharin additive content. We obtained the low-stress Permalloy Ni81 Fe19 in our experimental conditions. We fabricated a bistable electromagnetic RF MEMS switch with deformation-free cantilever beam using the electroplated Permalloy. [ABSTRACT FROM AUTHOR]
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قاعدة البيانات: Business Source Index
الوصف
تدمد:00189464
DOI:10.1109/TMAG.2005.859438