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المؤلفون: Takuya Murooka, Takayuki Iwasaki, Hiromitsu Kato, Masahiko Ogura, Junya Yaita, Satoshi Yamasaki, Toshiharu Makino, Mutsuko Hatano, Stephen E. Saddow, Meralys Natal
المصدر: IEEE Transactions on Electron Devices. 67:212-216
مصطلحات موضوعية: 010302 applied physics, Materials science, business.industry, Schottky barrier, Diamond, Schottky diode, SBDS, engineering.material, 01 natural sciences, Crystallographic defect, Electronic, Optical and Magnetic Materials, Rectification, 0103 physical sciences, engineering, Optoelectronics, Electrical and Electronic Engineering, business, Diode, Leakage (electronics)
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::ddfa7d54ce5cec88298398e5f7e9bd38Test
https://doi.org/10.1109/ted.2019.2952910Test -
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المؤلفون: Meng-meng Gao, Ting-ting Hu, Zhi-Zhan Chen
المصدر: IEEE Transactions on Electron Devices. 66:3929-3934
مصطلحات موضوعية: 010302 applied physics, Materials science, Condensed matter physics, Scanning electron microscope, Annealing (metallurgy), Schottky barrier, Schottky diode, SBDS, 01 natural sciences, Electronic, Optical and Magnetic Materials, chemistry.chemical_compound, chemistry, 0103 physical sciences, Homogeneity (physics), Silicon carbide, Electrical and Electronic Engineering, Diode
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::0099615a70d96f9ee31507d294051d56Test
https://doi.org/10.1109/ted.2019.2929827Test -
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المؤلفون: Osman Çiçek, Serhat Orkun Tan, H. Tecimer
المصدر: IEEE Transactions on Electron Devices. 64:984-990
مصطلحات موضوعية: 010302 applied physics, Materials science, Equivalent series resistance, business.industry, Schottky barrier, Schottky diode, Insulator (electricity), 02 engineering and technology, SBDS, 021001 nanoscience & nanotechnology, Metal–semiconductor junction, 01 natural sciences, Electronic, Optical and Magnetic Materials, Gallium arsenide, chemistry.chemical_compound, chemistry, 0103 physical sciences, Optoelectronics, Electrical and Electronic Engineering, 0210 nano-technology, business, Diode
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::56a2d37a88ce562bcab4bf9c5eb95ad5Test
https://doi.org/10.1109/ted.2016.2647380Test -
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المؤلفون: Kung-Yen Lee, Yan-Hao Huang
المصدر: IEEE Transactions on Electron Devices. 59:694-699
مصطلحات موضوعية: Resistive touchscreen, Materials science, business.industry, Schottky barrier, Schottky diode, Polishing, SBDS, Electronic, Optical and Magnetic Materials, chemistry.chemical_compound, chemistry, Chemical-mechanical planarization, Silicon carbide, Optoelectronics, Electrical and Electronic Engineering, business, Diode
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::a5463a8dd3b63997a65068d7fed3ad80Test
https://doi.org/10.1109/ted.2011.2181391Test -
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المؤلفون: Y. Ishimaru, N. Takahashi, Y. Zhu, M. Shimizu
المصدر: IEEE Transactions on Electron Devices. 45:2032-2036
مصطلحات موضوعية: Materials science, business.industry, Schottky barrier, Schottky diode, SBDS, Capacitance, Electronic, Optical and Magnetic Materials, chemistry.chemical_compound, chemistry, Electric field, Indium phosphide, Optoelectronics, Electrical and Electronic Engineering, business, Diode, Voltage
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::8585787365ff6668f2e9ab3f4e6919b1Test
https://doi.org/10.1109/16.711371Test -
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المؤلفون: Tohru Nakamura, Kiyoji Ikeda, Kazuhiko Sagara, Kazuo Nakazato, Takahiro Onai, M. Namba, Motoaki Matsumoto, Yoichi Tamaki, Tetsuya Hayashida, Noriyuki Homma
المصدر: IEEE Transactions on Electron Devices. 35:2094-2100
مصطلحات موضوعية: Materials science, business.industry, Transistor, Electrical engineering, SBDS, Noise (electronics), Electronic, Optical and Magnetic Materials, law.invention, Soft error, Memory cell, law, Hardware_INTEGRATEDCIRCUITS, Optoelectronics, Electrical and Electronic Engineering, Resistor, business, Conventional memory, Diode
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::36edf8b0f1585b134053ceb392f70a83Test
https://doi.org/10.1109/16.8782Test