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المصدر: Repositório Institucional da UFBA
Universidade Federal da Bahia (UFBA)
instacron:UFBAمصطلحات موضوعية: Transistor model, Circuit modelin, Engineering, business.industry, Amplifier, Transistor, Electrical engineering, NQS, Common source, Hardware_PERFORMANCEANDRELIABILITY, Integrated circuit design, MOS analog integrated circuits, Condensed Matter::Mesoscopic Systems and Quantum Hall Effect, integrated circuit design, law.invention, law, MOSFET, Hardware_INTEGRATEDCIRCUITS, Electronic engineering, Electrical and Electronic Engineering, business, MOS devices, Hardware_LOGICDESIGN, Static induction transistor
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::1e7a6c9935bdff6e75f95458619254a4Test
https://doi.org/10.1109/4.720397Test -
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المؤلفون: Michael Schroter, Hans-Martin Rein
المصدر: IEEE Journal of Solid-State Circuits. 30:551-562
مصطلحات موضوعية: Transistor model, Engineering, business.industry, Circuit design, Transistor, NQS, Electrical engineering, Common collector, Integrated circuit, law.invention, Computer Science::Hardware Architecture, law, Electronic engineering, Equivalent circuit, Electrical and Electronic Engineering, business, Simulation, Common emitter
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::8e65217fb64ed6a1d78ec18d8d8bdb95Test
https://doi.org/10.1109/4.384168Test -
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المؤلفون: K. Chin, Ching-Te Chuang, B.S. Wu
المصدر: IEEE Journal of Solid-State Circuits. 28:613-617
مصطلحات موضوعية: business.industry, Computer science, Bipolar junction transistor, Electrical engineering, NQS, Hardware_PERFORMANCEANDRELIABILITY, Integrated circuit, Discrete circuit, Emitter-coupled logic, ASTAP, Electronic circuit simulation, law.invention, law, Logic gate, Hardware_INTEGRATEDCIRCUITS, Electronic engineering, Equivalent circuit, Electrical and Electronic Engineering, Resistor, business, Hardware_LOGICDESIGN, Electronic circuit
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::bd2760dbddd577198de3bcfceceb5c82Test
https://doi.org/10.1109/4.229392Test