Fully Coupled Electrothermal Simulation of Large RRAM Arrays in the 'Thermal-House'

التفاصيل البيبلوغرافية
العنوان: Fully Coupled Electrothermal Simulation of Large RRAM Arrays in the 'Thermal-House'
المؤلفون: Wen Sheng Zhao, Wenchao Chen, Kai Kang, Wen-Yan Yin, Guo Dong Zhu, Jose E. Schutt-Aine, Da-Wei Wang, Pingqi Gao
المصدر: IEEE Access. 7:3897-3908
بيانات النشر: Institute of Electrical and Electronics Engineers (IEEE), 2019.
سنة النشر: 2019
مصطلحات موضوعية: Random access memory, Materials science, General Computer Science, General Engineering, 02 engineering and technology, Thermal management of electronic devices and systems, 010402 general chemistry, 021001 nanoscience & nanotechnology, 01 natural sciences, 0104 chemical sciences, Resistive random-access memory, Parallel simulation, Fully coupled, Crosstalk (biology), Reliability (semiconductor), Thermal, Electronic engineering, General Materials Science, Electrical and Electronic Engineering, 0210 nano-technology
الوصف: Thermal crosstalk in a highly integrated RRAM array due to the self-heating effect is one of the most critical issues affecting device reliability. In this paper, two types of “thermal-house” structures are proposed to optimize the thermal management of the RRAM array. An in-house developed parallel simulator is employed to study the performance of the proposed thermal house structures in terms of resistance ratio and crosstalk temperature. It is demonstrated that the proposed thermal house structures can help to reduce thermal crosstalk in high-density RRAM arrays. Some suggestions are also provided for further improving the thermal management capability of the thermal houses as well.
تدمد: 2169-3536
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::3fb632e348ab557df8f78255ed5d9f17Test
https://doi.org/10.1109/access.2018.2888572Test
حقوق: OPEN
رقم الانضمام: edsair.doi...........3fb632e348ab557df8f78255ed5d9f17
قاعدة البيانات: OpenAIRE