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1
المؤلفون: Zurauskaite, Laura, Abedin, Ahmad, Hellström, Per-Erik, 1970, Östling, Mikael
المصدر: ECS Transactions. :387-393
مصطلحات موضوعية: Germanium compounds, Interface states, Logic gates, Si-Ge alloys, Silica, Silicates, Silicon, Silicon oxides, Thulium compounds, CMOS devices, Epitaxially grown, Gate stacks, Ge surfaces, Interface state density, Interfacial layer, Oxide trap density, Ultra-thin, Passivation
وصف الملف: electronic
الوصول الحر: https://urn.kb.se/resolve?urn=urn:nbn:se:kth:diva-285309Test
https://kth.diva-portal.org/smash/get/diva2:1505880/FULLTEXT01.pdfTest -
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المؤلفون: Koji Kita
المصدر: ECS Transactions. 104:193-199
مصطلحات موضوعية: Materials science, Passivation, business.industry, Interface (computing), Gate stack, Optoelectronics, Flat band, business, Voltage
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::192838998054c95a7ed9414c9dbe0af0Test
https://doi.org/10.1149/10404.0193ecstTest -
3
المؤلفون: Moulik Patel, Hieu Pham Trung Nguyen, Ravi Teja Velpula, Barsha Jain
المصدر: ECS Transactions. 102:35-42
مصطلحات موضوعية: Materials science, Passivation, business.industry, Extraction (chemistry), Ultraviolet light emitting diodes, Nanowire, Optoelectronics, business, Layer (electronics)
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::c8a119448dff508ddb96a54a90e21edcTest
https://doi.org/10.1149/10203.0035ecstTest -
4
المؤلفون: David Kusmič, Ondrej Cech, Lenka Klakurková
المصدر: ECS Transactions. 99:231-239
مصطلحات موضوعية: Materials science, Passivation, chemistry.chemical_element, engineering.material, Microstructure, Indentation hardness, Corrosion, Chromium, chemistry, Phase (matter), engineering, Austenitic stainless steel, Nitriding, Nuclear chemistry
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::8b8d08d3d3d74545c0caaa5ae97947c9Test
https://doi.org/10.1149/09901.0231ecstTest -
5
المؤلفون: Sung-Jae Chang, Seong-Il Kim, Soo Cheol Kang, Kyu Jun Cho, Jong-Won Lim, Hae Cheon Kim, Hyun-Wook Jung, Sang-Heung Lee, Hokyun Ahn, Youn Sub Noh
المصدر: ECS Transactions. 98:519-526
مصطلحات موضوعية: Electron mobility, Proton radiation, Compressive strength, Materials science, Passivation, business.industry, Optoelectronics, Device Properties, Dielectric, business, Layer (electronics), Deposition (law)
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::8538bc1238c07702c4a659e03b4d2992Test
https://doi.org/10.1149/09805.0519ecstTest -
6
المؤلفون: Jia Quan Su, Yue Kuo
المصدر: ECS Transactions. 98:99-105
مصطلحات موضوعية: Copper oxide, chemistry.chemical_compound, Materials science, chemistry, Passivation, Metallurgy, chemistry.chemical_element, Plasma, Copper, Electromigration
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::03d40c5dfc7ecbaa3995a65ead66d543Test
https://doi.org/10.1149/09803.0099ecstTest -
7
المؤلفون: Ahmad Abedin, Laura Zurauskaite, Per-Erik Hellström, Mikael Östling
المصدر: ECS Transactions. 98:387-393
مصطلحات موضوعية: Thulium compounds, Ge surfaces, Silicon, Ultra-thin, Materials science, Passivation, Silicon oxides, CMOS devices, Oxide, chemistry.chemical_element, Epitaxy, chemistry.chemical_compound, Germanium compounds, Annan elektroteknik och elektronik, Interface state density, Other Electrical Engineering, Electronic Engineering, Information Engineering, business.industry, Silicates, Logic gates, Silica, Interface states, Oxide trap density, Silicate, Gate stacks, Thulium, CMOS, chemistry, Trap density, Interfacial layer, Optoelectronics, Si-Ge alloys, Epitaxially grown, business
وصف الملف: application/pdf
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::be0e306ade1e040a300ce580bfc8f4daTest
https://doi.org/10.1149/09805.0387ecstTest -
8
المؤلفون: Robert Steinberger-Wilckens, Ahmad El-Kharouf, Kun Zhang
المصدر: ECS Transactions
مصطلحات موضوعية: Materials science, Passivation, Metallurgy, Alloy, Evaporation, engineering.material, Cathode, law.invention, Corrosion, law, Heat exchanger, engineering, Degradation (geology), Current (fluid)
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::e8dcc3667aa00ea6a9a5a0b61a4686d9Test
https://doi.org/10.1149/09101.2253ecstTest -
9
المؤلفون: Keisuke Yamamoto, Dong Wang, Wei Chen Wen, Hiroshi Nakashima
المصدر: ECS Transactions. 92:3-10
مصطلحات موضوعية: Thermal oxidation, Deep-level transient spectroscopy, Materials science, Passivation, Annealing (metallurgy), business.industry, Gate stack, law.invention, Capacitor, law, Evaluation methods, Optoelectronics, business, Order of magnitude
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::9fcfb6874b830d5eb376bbf050e764fcTest
https://doi.org/10.1149/09204.0003ecstTest -
10
المؤلفون: Mattia Pasquali, Silvia Armini, Stefan De Gendt
المصدر: ECS Transactions. 92:25-32
مصطلحات موضوعية: Organic film, Atomic layer deposition, Materials science, Passivation, Chemical engineering, Selective deposition
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::37975cd3bd1b771d859bfbcd4dd78228Test
https://doi.org/10.1149/09203.0025ecstTest