دورية أكاديمية
Four-probe scanning tunnelling microscope with atomic resolution for electrical and electro-optical property measurements of nanosystems.
| العنوان: | Four-probe scanning tunnelling microscope with atomic resolution for electrical and electro-optical property measurements of nanosystems. |
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| المؤلفون: | Xiao, Lin, Xiao-Bo, He, Jun-Ling, Lu, Li, Gao, Qing, Huan, Dong-Xia, Shi, Hong-Jun, Gao |
| المصدر: | Chinese Physics; Aug2005, Vol. 14 Issue 8, p1-1, 1p |
| قاعدة البيانات: | Complementary Index |
| تدمد: | 10091963 |
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| DOI: | 10.1088/1009-1963/14/8/011 |