نتائج البحث - "A. Melcher"

1

The power of light: Self-organized formation of macroscopic amounts of silica melts controlled by laser light

المؤلفون: Jürgen G. Heinrich, Carina Oelgardt, Jörg Melcher, Jens Günster

المصدر: Applied Physics Letters. 94:021114

مصطلحات موضوعية: Work (thermodynamics), potential, Physics and Astronomy (miscellaneous), business.industry, Chemistry, ceramic, Physics::Optics, Dielectric, self-organization, light-material-interaction, laser, Power (physics), Surface tension, shrinkage, Optics, Impurity, Continuous wave, Self-assembly, Composite material, business, energy, Laser light

الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::1d3130a0fe283fd9984a0b7aad0289b4Test
https://doi.org/10.1063/1.3000637Test

2

دورية أكاديمية

A self-calibrating optomechanical force sensor with femtonewton resolution.

المؤلفون: Melcher, John¹ john.melcher@nist.gov, Stirling, Julian¹, Cervantes, Felipe Guzmán^1,2, Pratt, Jon R.¹, Shaw, Gordon A.¹

المصدر: Applied Physics Letters. 12/8/2014, Vol. 105 Issue 23, p1-4. 4p. 1 Diagram, 1 Chart, 3 Graphs.

مصطلحات موضوعية: *FREQUENCY modulation detectors, *CALIBRATION, *ATOMIC force microscopy, *CHEMICAL bonds, *MAGNETIC resonance force microscopy

3

Scanning electron and cathodoluminescence imaging of thin film Lu2SiO5:Ce scintillating materials

المؤلفون: Charles L. Melcher, Jonathan D. Peak, James M. Fitz-Gerald, P. D. Rack

المصدر: Applied Physics Letters. 91:244102

مصطلحات موضوعية: Photoluminescence, Materials science, Physics and Astronomy (miscellaneous), business.industry, Scanning electron microscope, Cathodoluminescence, Substrate (electronics), Surface coating, Optics, Sputtering, Optoelectronics, Thin film, business, Luminescence

الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::ff9d02ee85e0bf1f2c4a5bb95736aa83Test
https://doi.org/10.1063/1.2821115Test

4

Equivalent point-mass models of continuous atomic force microscope probes

المؤلفون: Arvind Raman, John Melcher, Shuiqing Hu

المصدر: Applied Physics Letters. 91:053101

مصطلحات موضوعية: Kelvin probe force microscope, Physics, Classical mechanics, Physics and Astronomy (miscellaneous), Normal mode, Magnetic force microscope, Equivalence point, Kinetic energy, Equivalence (measure theory), Non-contact atomic force microscopy, Nanoscopic scale

الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::9472f7a6accb17e2c1751fd0b7d84574Test
https://doi.org/10.1063/1.2767173Test

5

دورية أكاديمية

The power of light: Self-organized formation of macroscopic amounts of silica melts controlled by laser light.

المؤلفون: Günster, J., Oelgardt, C., Heinrich, J. G., Melcher, J.

المصدر: Applied Physics Letters; 1/12/2009, Vol. 94 Issue 2, pN.PAG, 3p, 2 Color Photographs

مصطلحات موضوعية: LASERS, SILICA, SURFACE tension, IRRADIATION, DIELECTRICS, LIGHT

6

دورية أكاديمية

Multiple impact regimes in liquid environment dynamic atomic force microscopy.

المؤلفون: Melcher, John¹, Xin Xu¹, Raman, Arvind¹ raman@purdue.edu

المصدر: Applied Physics Letters. 9/1/2008, Vol. 93 Issue 9, p093111. 3p. 3 Graphs.

مصطلحات موضوعية: *ATOMIC force microscopy, *SCANNING probe microscopy, *BUFFER solutions, *HYDROGEN-ion concentration, *FLUCTUATIONS (Physics), *ACIDITY function

7

دورية أكاديمية

Scanning electron and cathodoluminescence imaging of thin film Lu2SiO5:Ce scintillating materials.

المؤلفون: Rack, P. D., Peak, J. D., Melcher, C. L., Fitz-Gerald, J. M.

المصدر: Applied Physics Letters; 12/10/2007, Vol. 91 Issue 24, p244102, 3p, 4 Diagrams

مصطلحات موضوعية: CATHODOLUMINESCENCE, SCINTILLATORS, LUTETIUM, THIN films, OPTICAL properties, SILICATES, CERIUM, SPUTTERING (Physics), SCANNING electrochemical microscopy

8

دورية أكاديمية

Equivalent point-mass models of continuous atomic force microscope probes.

المؤلفون: Melcher, John¹, Hu, Shuiqing¹, Raman, Arvind¹

المصدر: Applied Physics Letters. 7/30/2007, Vol. 91 Issue 5, p053101. 3p. 3 Diagrams.

مصطلحات موضوعية: *ATOMIC force microscopy, *MICROMECHANICS, *NANOTECHNOLOGY, *MICROSCOPY, *MICROELECTROMECHANICAL systems

9

Noncontact thermal‐wave imaging of subsurface structure with infrared detection

المؤلفون: F. H. Dacol, Helmut Ermert, T. Baumann, R. L. Melcher

المصدر: Applied Physics Letters. 44:1136-1138

مصطلحات موضوعية: Materials science, Physics and Astronomy (miscellaneous), business.industry, Infrared, Iterative reconstruction, Sample (graphics), Optics, Thermal radiation, Thermal infrared spectroscopy, Thermal, Cathode ray, Optoelectronics, Thermal blooming, business

الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::5fee97c4aae40a9cafaaed5328623ca4Test
https://doi.org/10.1063/1.94668Test

10

Thermoacoustic detection of electron paramagnetic resonance

المؤلفون: R.L. Melcher

المصدر: Applied Physics Letters. 37:895-897

مصطلحات موضوعية: Electron nuclear double resonance, Physics and Astronomy (miscellaneous), Pulsed EPR, Chemistry, Physics::Optics, Resonance, law.invention, Amplitude modulation, Nuclear magnetic resonance, law, Atomic physics, Electron paramagnetic resonance, Absorption (electromagnetic radiation), Photoacoustic spectroscopy, Microwave

الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::0d47d3cb80a107e055c995841a23c795Test
https://doi.org/10.1063/1.91850Test

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