التفاصيل البيبلوغرافية
| العنوان: |
Spectromicroscopy of tantalum oxide memristors. |
| المؤلفون: |
Strachan, John Paul, Medeiros-Ribeiro, Gilberto, Yang, J. Joshua, Zhang, M.-X., Miao, Feng, Goldfarb, Ilan, Holt, Martin, Rose, Volker, Williams, R. Stanley |
| المصدر: |
Applied Physics Letters; 6/13/2011, Vol. 98 Issue 24, p242114, 3p, 3 Graphs |
| مصطلحات موضوعية: |
TANTALUM oxide, TRANSITION metals, X-ray spectroscopy, POLYCRYSTALLINE semiconductors, THIN films, METALLIC oxides |
| مستخلص: |
We report experiments to measure material changes in tantalum oxide-based memristive devices. The high endurance and low power demonstrated in this material system suggests a unique mechanism for the switching, which we investigated using x-ray based spectromicroscopy and nanospectroscopy. Our study nondestructively identified a localized (<150nm diameter) Ta-rich phase surrounded by nano- or polycrystalline Ta2O5. [ABSTRACT FROM AUTHOR] |
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| قاعدة البيانات: |
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