التفاصيل البيبلوغرافية
| العنوان: |
In-situ observation of nanomechanical behavior arising from critical-temperature-induced phase transformation in Ba(Zr0.2Ti0.8)O3-0.5(Ba0.7Ca0.3)TiO3 thin film. |
| المؤلفون: |
Wang, Z. M., Cai, Zh. L., Zhao, K., Guo, X. L., Chen, J., Sun, W., Cheng, Zh. X., Kimura, H., Li, B. W., Yuan, G. L., Yin, J., Liu, Zh. G. |
| المصدر: |
Applied Physics Letters; 8/12/2013, Vol. 103 Issue 7, p071902-071902-4, 1p, 5 Graphs |
| مصطلحات موضوعية: |
IN situ microanalysis, X-ray diffraction, RESIDUAL stresses, PIEZOELECTRIC devices, NANOINDENTATION tests, NANOELECTROMECHANICAL systems |
| مستخلص: |
In this Letter, we use the nanoindentation technique and vary the testing temperature to above and below critical values to study the nanomechanical features of a strong Pb-free piezoelectric Ba(Zr0.2Ti0.8)O3-0.5(Ba0.7Ca0.3)TiO3 (BZT-0.5BCT) thin film across its piezoelectric-optimal morphotropic phase boundary. The mechanisms responsible for the Young's modulus and hardness evolution are then discussed. An X-ray diffraction method that can detect the d(110) variation associated with the change in the inclination angle ψ of the (110) plane was developed to quantify the residual stress in the BZT-0.5BCT films. [ABSTRACT FROM AUTHOR] |
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| قاعدة البيانات: |
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