Transferred, Ultrathin Oxide Bilayers as Biofluid Barriers for Flexible Electronic Implants

التفاصيل البيبلوغرافية
العنوان: Transferred, Ultrathin Oxide Bilayers as Biofluid Barriers for Flexible Electronic Implants
المؤلفون: Ki Jun Yu, Younghee Yoon, Yonggang Huang, Yoon Kyeung Lee, John A. Rogers, Rui Li, Zhaoqian Xie, Guanhua Fang, Jinghua Li, Yerim Kim, Haina Du, Jize Zhang, Yiding Zhong, Hui Fang, Xin Jin, Yongfeng Mei, Muhammad A. Alam, Enming Song
المصدر: Advanced Functional Materials. 28:1702284
بيانات النشر: Wiley, 2017.
سنة النشر: 2017
مصطلحات موضوعية: 0301 basic medicine, Materials science, Orders of magnitude (temperature), Silicon dioxide, Bilayer, Oxide, Nanotechnology, Biasing, 02 engineering and technology, 021001 nanoscience & nanotechnology, Condensed Matter Physics, Electronic, Optical and Magnetic Materials, Biomaterials, 03 medical and health sciences, chemistry.chemical_compound, Atomic layer deposition, 030104 developmental biology, chemistry, Electrochemistry, Wafer, 0210 nano-technology, Dissolution
الوصف: The work presented here introduces a materials strategy that involves physically transferred, ultrathin layers of silicon dioxide (SiO2) thermally grown on silicon wafers and then coated with hafnium oxide (HfO2) by atomic layer deposition, as barriers that satisfy requirements for even the most challenging flexible electronic devices. Materials and physics aspects of hydrolysis and ionic transport associated with such bilayers define their performance and reliability characteristics. Systematic experimental studies and reactive diffusion modeling suggest that the HfO2 film, even with some density of pinholes, slows dissolution of the underlying SiO2 by orders of magnitude, independent of the concentration of ions in the surrounding biofluids. Accelerated tests that involve immersion in phosphate-buffered saline solution at a pH of 7.4 and under a constant electrical bias demonstrate that this bilayer barrier can also obstruct the transport of ions that would otherwise cause drifts in the operation of the electronics. Theoretical drift–diffusion modeling defines the coupling of dissolution and ion diffusion, including their effects on device lifetime. Demonstrations of such barriers with passive and active components in thin, flexible electronic test structures highlight the potential advantages for wide applications in chronic biointegrated devices.
تدمد: 1616-3028
1616-301X
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::0015a57a0080f879a3a58bd2c9407cd0Test
https://doi.org/10.1002/adfm.201702284Test
حقوق: CLOSED
رقم الانضمام: edsair.doi...........0015a57a0080f879a3a58bd2c9407cd0
قاعدة البيانات: OpenAIRE