مؤتمر
Measuring of parasitic resistance of stacked chip of Si power device
| العنوان: | Measuring of parasitic resistance of stacked chip of Si power device |
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| المؤلفون: | Ohguro, Tatsuya, Kojima, Hideharu, Hara, Takuma, Nishiwaki, Tatsuya, Kobayashi, Kenya |
| المصدر: | 2023 35th International Conference on Microelectronic Test Structure (ICMTS) |
| بيانات النشر: | IEEE |
| سنة النشر: | 2023 |
| نوع الوثيقة: | conference object |
| اللغة: | unknown |
| DOI: | 10.1109/icmts55420.2023.10094137 |
| الإتاحة: | https://doi.org/10.1109/icmts55420.2023.10094137Test http://xplorestaging.ieee.org/ielx7/10094038/10094053/10094137.pdf?arnumber=10094137Test |
| حقوق: | https://doi.org/10.15223/policy-029Test ; https://doi.org/10.15223/policy-037Test |
| رقم الانضمام: | edsbas.3A496A4A |
| قاعدة البيانات: | BASE |
| DOI: | 10.1109/icmts55420.2023.10094137 |
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