مؤتمر
Investigation of power semiconductor devices under applying voltage by multi-purpose scanning probe microscope
| العنوان: | Investigation of power semiconductor devices under applying voltage by multi-purpose scanning probe microscope |
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| المؤلفون: | SATOH, Nobuo, DOI, Atsushi, YAMAMOTO, Hidekazu |
| المصدر: | 2020 IEEE Workshop on Wide Bandgap Power Devices and Applications in Asia (WiPDA Asia) |
| بيانات النشر: | IEEE |
| سنة النشر: | 2020 |
| نوع الوثيقة: | conference object |
| اللغة: | unknown |
| DOI: | 10.1109/wipdaasia49671.2020.9360252 |
| الإتاحة: | https://doi.org/10.1109/wipdaasia49671.2020.9360252Test http://xplorestaging.ieee.org/ielx7/9360228/9360248/09360252.pdf?arnumber=9360252Test |
| حقوق: | https://ieeexplore.ieee.org/Xplorehelp/downloads/license-information/IEEE.htmlTest ; https://doi.org/10.15223/policy-029Test ; https://doi.org/10.15223/policy-037Test |
| رقم الانضمام: | edsbas.1AA79756 |
| قاعدة البيانات: | BASE |
| DOI: | 10.1109/wipdaasia49671.2020.9360252 |
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