مؤتمر
Multi-subband interface roughness scattering using 3D Finite Element Monte Carlo with 2D Schödinger equation for simulations of sub-16nm FinFETs
| العنوان: | Multi-subband interface roughness scattering using 3D Finite Element Monte Carlo with 2D Schödinger equation for simulations of sub-16nm FinFETs |
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| المؤلفون: | Nagy, Daniel, Elmessary, Muhammad A., Aldegunde, Manuel, Lindberg, Jari, Garcia-Loureiro, Antonio J., Kalna, Karol |
| المصدر: | 2015 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) |
| بيانات النشر: | IEEE |
| سنة النشر: | 2015 |
| نوع الوثيقة: | conference object |
| اللغة: | unknown |
| DOI: | 10.1109/sispad.2015.7292338 |
| الإتاحة: | https://doi.org/10.1109/sispad.2015.7292338Test http://xplorestaging.ieee.org/ielx7/7274904/7292241/07292338.pdf?arnumber=7292338Test |
| رقم الانضمام: | edsbas.91A13C5C |
| قاعدة البيانات: | BASE |
| DOI: | 10.1109/sispad.2015.7292338 |
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