مؤتمر
Multi-subband interface roughness scattering using 3D Finite Element Monte Carlo with 2D Schödinger equation for simulations of sub-16nm FinFETs.
| العنوان: | Multi-subband interface roughness scattering using 3D Finite Element Monte Carlo with 2D Schödinger equation for simulations of sub-16nm FinFETs. |
|---|---|
| المؤلفون: | Nagy, Daniel, Elmessary, Muhammad A., Aldegunde, Manuel, Lindberg, Jari, Garcia-Loureiro, Antonio J., Kalna, Karol |
| المصدر: | 2015 12th IEEE International Conference on Advanced Video & Signal Based Surveillance (AVSS); 2015, p377-380, 4p |
| قاعدة البيانات: | Complementary Index |
| ردمك: | 9781467376327 |
|---|---|
| DOI: | 10.1109/SISPAD.2015.7292338 |